Full name Familienname, Vorname
Aresu, S.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Rott, K. ; Reisinger, H. ; Aresu, S. ; Schlünder, C. ; Kölpin, K. ; Gustin, W. ; Grasser, T. New Insights on the PBTI Phenomena in SiON pMOSFETsArtikel Article2012
2Rott, K. ; Schmitt-Landsiedel, D. ; Reisinger, H. ; Rott, Gunnar Andreas ; Georgakos, G ; Schluender, C ; Aresu, S. ; Gustin, W. ; Grasser, Tibor Impact and measurement of short term threshold instabilities in MOSFETs of analog circuitsKonferenzbeitrag Inproceedings2012
3Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided OxidesArtikel Article 2009
4Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. The Effect of Recovery on NBTI Characterization of Thick Non-Nitrided OxidesKonferenzbeitrag Inproceedings2008