Full name Familienname, Vorname
Camargo, V. V. A.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Camargo, V. V. A. ; Kaczer, Ben ; Grasser, Tibor ; Wirth, G. Circuit Simulation of Workload-Dependent RTN and BTI Based on Trap KineticsArtikel Article2014
2Kaczer, Ben ; Toledano-Luque, M. ; Franco, J. ; Grasser, Tibor ; Roussel, Ph. J. ; Camargo, V. V. A. ; Mahato, S. ; Simoen, E. ; Catthoor, F. ; Wirth, G.I. ; Groeseneken, G. Recent Trends in CMOS Reliability: From Individual Traps to Circuit SimulationsKonferenzbeitrag Inproceedings2011