Full name Familienname, Vorname
Merk, B
 

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PreviewAuthor(s)TitleTypeIssue Date
1Hofbauer, Michael ; Schweiger, Kurt ; Dietrich, Horst ; Zimmermann, Horst ; Schmid, Ulrich ; Merk, B Single Event Effect Measurements in 90nm CMOS Circuits at the Microbeam Facility for the Project FATALKonferenzbeitrag Inproceedings2012
2Hofbauer, Michael ; Schweiger, Kurt ; Dietrich, Horst ; Zimmermann, Horst ; Voss, K.O. ; Merk, B ; Schmid, Ulrich ; Steininger, Andreas Pulse Shape Measurements by On-chip Sense Amplifiers of Single Event Transients Propagating through a 90 nm Bulk CMOS Inverter ChainPräsentation Presentation2012