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Heyns, Marc M.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Franco, J. ; Kaczer, Ben ; Mitard, J. ; Toledano-Luque, M. ; Crupi, F. ; Eneman, G. ; Roussel, Ph. J. ; Grasser, Tibor ; Cho, M. ; Kauerauf, T. ; Witters, L. ; Hellings, Geert ; Ragnarsson, L. A. ; Horiguchi, N. ; Heyns, Marc M. ; Groeseneken, G.	Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications	Konferenzbeitrag Inproceedings	2012
	2		Franco, J. ; Kaczer, Ben ; Mitard, J. ; Toledano-Luque, M. ; Eneman, G. ; Roussel, Ph. J. ; Cho, M. ; Kauerauf, T. ; Grasser, Tibor ; Witters, L. ; Hellings, Geert ; Ragnarsson, L. A. ; Horiguchi, N. ; Heyns, Marc M. ; Groeseneken, G.	Reliability of SiGe Channel MOS	Konferenzbeitrag Inproceedings	2012