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Mertens, H.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Chasin, A ; Franco, J. ; Kaczer, Ben ; Putcha, Vamsi ; Weckx, P. ; Ritzenthaler, Romain ; Mertens, H. ; Horiguchi, N. ; Linten, D ; Rzepa, Gerhard BTI Reliability and Time-Dependent Variability of Stacked Gate-All-Around Si Nanowire TransistorsKonferenzbeitrag Inproceedings2017
2Boschke, Roman ; Linten, D ; Hellings, Geert ; Chen, S.-H. ; Scholz, M ; Mitard, J. ; Mertens, H. ; Witters, L. ; Van Campenhout, Joris ; Verheyen, Peter ; Pogany, Dionyz ; Groeseneken, Guido ESD Characterization of Germanium diodesKonferenzbeitrag Inproceedings2014
3Franco, J. ; Kaczer, B. ; Roussel, Ph. J. ; Mitard, J. ; Sioncke, S. ; Witters, L. ; Mertens, H. ; Grasser, T. ; Groeseneken, G. Understanding the suppressed charge trapping in relaxed- and strained-Ge/SiO<inf>2</inf>/HfO<inf>2</inf> pMOSFETs and implications for the screening of alternative high-mobility substrate/dielectric CMOS gate stacksKonferenzbeitrag Inproceedings2013