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Chen, C. S.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Kaczer, Ben ; Chen, C. S. ; Watt, J. T. ; Chanda, K. ; Weckx, P. ; Toledano-Luque, M. ; Groeseneken, G. ; Grasser, Tibor	Reliability and Performance Considerations for NMOSFET Pass Gates in FPGA Applications	Konferenzbeitrag Inproceedings	2013