Full name Familienname, Vorname
Hussin, Razaidi
 

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PreviewAuthor(s)TitleTypeIssue Date
1Kaczer, Ben ; Amoroso, S. M. ; Hussin, Razaidi ; Asenov, A ; Franco, J. ; Weckx, P. ; Roussel, Ph. J. ; Rzepa, Gerhard ; Grasser, Tibor ; Horiguchi, N. On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defectsKonferenzbeitrag Inproceedings2016
2Gerrer, Louis ; Hussin, Razaidi ; Amoroso, Salvatore M. ; Franco, J. ; Weckx, P. ; Simicic, M. ; Horiguchi, N. ; Kaczer, Ben ; Grasser, T. ; Asenov, Asen Experimental evidences and simulations of trap generation along a percolation pathKonferenzbeitrag Inproceedings2015
3Amoroso, Salvatore Maria ; Gerrer, Louis ; Nedjalkov, Mihail ; Hussin, Razaidi ; Alexander, Craig ; Asenov, Asen Modelling Carriers Mobility in nano-MOSFETs in the Presence of Discrete Trapped Charges: Accuracy and IssuesArtikel Article2014