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Giering, K.-U.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Giering, K.-U. ; Puschkarsky, K. ; Reisinger, H. ; Rzepa, G. ; Rott, G. ; Vollertsen, R. ; Grasser, T. ; Jancke, R.	NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling	Artikel Article	2019
	2		Giering, K.-U. ; Rott, G. ; Rzepa, G. ; Reisinger, H. ; Puppala, A.K. ; Reich, T. ; Gustin, W. ; Grasser, T. ; Jancke, R.	Analog-circuit NBTI degradation and time-dependent NBTI variability: An efficient physics-based compact model	Konferenzbeitrag Inproceedings	2016