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Voss, Kay-Obbe
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Hofbauer, Michael ; Steindl, Bernhard ; Schneider-Hornstein, Kerstin ; Goll, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Single-Event Transients in a PIN Photodiode and a Single-Photon Avalanche Diode Integrated in 0.35μm CMOSKonferenzbeitrag Inproceedings 2018
2Mitrovic, Mladen ; Hofbauer, Michael ; Schneider-Hornstein, Kerstin ; Goll, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Evidence of Pulse Quenching in AND and OR Gates by experimental Probing of Full Single-Event Transient WaveformsArtikel Article 2018
3Mitrovic, Mladen ; Hofbauer, Michael ; Voss, Kay-Obbe ; Zimmermann, Horst Experimental Investigation of the Joint lnfluence of Reduced Supply Voltage and Charge Sharing on Single-Event Transient Waveforms in 65-nm Triple-Well CMOSArtikel Article 2018
4Mitrovic, Mladen ; Hofbauer, Michael ; Goll, Bernhard ; Schneider-Hornstein, Kerstin ; Swoboda, Robert ; Steindl, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Dependence of inverter chain single-event cross sections on inverter spacing in 65 nm bulk CMOS technologyKonferenzbeitrag Inproceedings 2017
5Mitrovic, Mladen ; Hofbauer, Michael ; Goll, Bernhard ; Schneider-Hornstein, Kerstin ; Swoboda, Robert ; Steindl, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst A DC-to-8.5 GHz 32:1 Analog Multiplexer for On-Chip Continuous-Time Probing of Single-Event Transients in a 65-nm CMOSArtikel Article 2017
6Mitrovic, Mladen ; Hofbauer, Michael ; Goll, Bernhard ; Schneider-Hornstein, Kerstin ; Swoboda, Robert ; Steindl, Bernhard ; Voss, Kay-Obbe ; Zimmermann, Horst Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65-nm CMOSArtikel Article 2017
7Veeravalli, Varadan Savulimedu ; Polzer, Thomas ; Schmid, Ulrich ; Steininger, Andreas ; Hofbauer, Michael ; Schweiger, Kurt ; Dietrich, Horst ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst ; Voss, Kay-Obbe ; Merk, Bruno ; Hajek, Michael An infrastructure for accurate characterization of single-event transients in digital circuitsArtikel Article2013