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Full name Familienname, Vorname
Stemmer, A.
 

Own Publications Eigene Publikationen

Results 1-15 of 15 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Rieber, Jochen M. ; Schitter, Georg ; Stemmer, A. ; Allgöwer, F. Experimental application of l1-optimal control for an atomic force microscopeKonferenzbeitrag Inproceedings2005
2Schitter, Georg ; Stemmer, A. Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning probe microscopyArtikel Article2004
3Stark, Robert ; Schitter, Georg ; Stemmer, A. Velocity dependend friction laws in contact mode atomic-force microscopyArtikel Article2004
4Schitter, Georg ; Stark, Robert ; Stemmer, A. Fast contact-mode atomic force microscopy on biological specimen by model-based controlArtikel Article2004
5Schitter, Georg ; Allgöwer, F. ; Stemmer, A. A new control strategy for high-speed atomic force microscopyArtikel Article2004
6Stark, Robert ; Schitter, Georg ; Stark, Martin ; Guckenberger, Reinhard ; Stemmer, A. State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopyArtikel Article2004
7Haefliger, Daniel ; Muhenchinger, Marc ; Schitter, Georg ; Stemmer, A. An integrated piezo-acoustic shear-force distance sensor with nanometer resolution for a micropipette toolArtikel Article2003
8Schitter, Georg ; Stemmer, A. Model-based signal conditioning for high-speed atomic force and friction force microscopyArtikel Article2003
9Stark, Robert ; Schitter, Georg ; Stemmer, A. Tuning the interaction forces in tapping mode atomic-force microscopyArtikel Article2003
10Stark, Robert ; Schitter, Georg ; Stark, Martin ; Guckenberger, Reinhard ; Stemmer, A. Towards time-resolved dynamic atomic force microscopy: A state space model of the AFMKonferenzbeitrag Inproceedings2003
11Schitter, Georg ; Stemmer, A. ; Allgöwer, F. Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopyKonferenzbeitrag Inproceedings2003
12Schitter, Georg ; Stark, Robert ; Stemmer, A. Sensors for closed-loop piezo control: strain gauges versus optical sensorsArtikel Article2002
13Schitter, Georg ; Stemmer, A. Eliminating mechanical perturbations in scanning probe microscopyArtikel Article2002
14Schitter, Georg ; Stemmer, A. Fast closed loop control of piezoelectric transducersArtikel Article2002
15Schitter, Georg ; Menold, P- ; Knapp, H. ; Allgöwer, F. ; Stemmer, A. High performance feedback for fast scanning atomic force microscopesArtikel Article2001