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Fritzer, G.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Leicht, M. ; Fritzer, G. ; Basnar, B. ; Golka, Sebastian ; Smoliner, Jürgen	A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices	Präsentation Presentation	2001