Full name Familienname, Vorname
Baur, K.
 

Results 1-5 of 5 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3Präsentation Presentation2002
2Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated WafersPräsentation Presentation2002
3Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Kanngießer, B. ; Malzer, W. ; Palmetshofer, L. Measurements of light Element Implants in Si Wafers with SR-TXRFPräsentation Presentation2002
4Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3: Surface Contaminations and Depth ProfilesPräsentation Presentation2002
5Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3Präsentation Presentation2002