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Stamps, R.L.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Süss, Dieter ; Schrefl, Thomas ; Fidler, Josef ; Stamps, R.L. ; Kim, J.-V. Exchange bias and training effect in polycrystalline antiferromagnetic/ferromagnetic bilayersPräsentation Presentation2002
2Süss, Dieter ; Scholz, Werner ; Schrefl, Thomas ; Fidler, Josef ; Stamps, R.L. Micromagnetic simulation of antiferromagnetic/ferromagnetic structuresPräsentation Presentation2002