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Tham, A.T.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Petter, K. ; Eyidi, Dominique ; Stöger-Pollach, Michael ; Sieber, I. ; Schubert-Bischoff, P. ; Rau, B. ; Tham, A.T. ; Schattschneider, Peter ; Gall, S. ; Lips, K. ; Fuhs, W.	Line defects in epitaxial silicon films grown at 560°C	Artikel Article	2006
	2		Petter, K. ; Eyidi, Dominique ; Stöger-Pollach, Michael ; Sieber, I. ; Schubert-Bischoff, P. ; Rau, B. ; Tham, A.T. ; Schattschneider, Peter ; Gall, S. ; Lips, K. ; Fuhs, W.	Line defects in epitaxial silicon films grown at 560°C	Präsentation Presentation	2005