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Moon, D.W.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Werner, Wolfgang S.M. ; Tomastik, Christian ; Smekal, Werner ; Moon, D.W. ; Kim, K.J. ; Powell, C.J.	Film thickness determination of ultra thin HfO₂ dielectrics with angle resolved XPS: Experimental electron scattering data	Präsentation Presentation	2006