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Mathé, J.
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Horkel, Maximilian ; Eisenmenger-Sittner, Christoph ; Mathé, J. ; Eder, A. ; Beniaminov, R. ; Zawrel, R. Determination of the thickness and the refraction index of dielectric thin films with spatial resolution using optical consumer electronic componentsPräsentation Presentation2010