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Zawrel, R.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Vollnhofer, W. ; Zawrel, R. ; Eisenmenger-Sittner, Christoph	Four-Point Probe Resistivity Measurements on Polycrystalline Thin Films and Complex Metallic Alloy Coatings	Präsentation Presentation	2011
	2		Vollnhofer, W. ; Zawrel, R. ; Eisenmenger-Sittner, Christoph	Bestimmung der Korngrößen von polykristallinen Metalllegierungen mittels elektrischer Widerstandsmessung	Präsentation Presentation	2011
	3		Horkel, Maximilian ; Eisenmenger-Sittner, Christoph ; Mathé, J. ; Eder, A. ; Beniaminov, R. ; Zawrel, R.	Determination of the thickness and the refraction index of dielectric thin films with spatial resolution using optical consumer electronic components	Präsentation Presentation	2010