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Detlefs, B.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Mazel, Y. ; Valla, A. ; Ingerle, D. ; Detlefs, B. ; Lépy, M.-C. ; Novikova, A. ; Rodriguez, G. ; Streli, C. ; Nolot, E. Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysisArtikel Article 2017
2Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Ingerle, D. ; Novikova, A. ; Detlefs, B. ; Lépy, M. C. ; Licitra, C. ; Rodriguez, G. ; Streli, Christina ; Nolot, E. Elemental depth profiling in indium free TCO thin films for optoelectronic applicationsPräsentation Presentation2016
3Caby, B. ; Detlefs, B. ; Picot, G. ; Nolot, E. ; Brigidi, Fabio ; Pepponi, Giancarlo ; Ingerle, D. ; Streli, Christina ; Lutterotti, L. ; Chateigner, D. ; Morales, M. Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence MeasurementsPräsentation Presentation2015