Full name Familienname, Vorname
Rodriguez, G.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Mazel, Y. ; Valla, A. ; Ingerle, D. ; Detlefs, B. ; Lépy, M.-C. ; Novikova, A. ; Rodriguez, G. ; Streli, C. ; Nolot, E. Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysisArtikel Article 2017
2Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Ingerle, D. ; Novikova, A. ; Detlefs, B. ; Lépy, M. C. ; Licitra, C. ; Rodriguez, G. ; Streli, Christina ; Nolot, E. Elemental depth profiling in indium free TCO thin films for optoelectronic applicationsPräsentation Presentation2016
3Caby, Bérenger ; Brigidi, Fabio ; Ingerle, D. ; Nolot, E. ; Pepponi, Giancarlo ; Streli, Christina ; Lutterotti, L. ; André, A. ; Rodriguez, G. ; Gergaud, P. ; Morales, M. ; Chateigner, D. Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysisArtikel Article 2015