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Alfreider, M.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Glechner, T. ; Lang, S. ; Hahn, R. ; Alfreider, M. ; Moraes, V. ; Primetzhofer, D. ; Ramm, J. ; Kolozsvári, S. ; Kiener, D. ; Riedl, H.	Correlation between fracture characteristics and valence electron concentration of sputtered Hf-C-N based thin films	Artikel Article	2020