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Full name Familienname, Vorname
Krywka, C.
 

Own Publications Eigene Publikationen

Results 1-6 of 6 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Todt, J. ; Krywka, C. ; Zhang, Z.L. ; Mayrhofer, P.H. ; Keckes, J. ; Bartosik, M. Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffractionArtikel Article 2020
2Aschauer, E. ; Bartosik, M. ; Bolvardi, H. ; Arndt, M. ; Polcik, P. ; Davydok, A. ; Krywka, C. ; Riedl, H. ; Mayrhofer, P.H. Strain and stress analyses on thermally annealed Ti-Al-N/Mo-Si-B multilayer coatings by synchrotron X-ray diffractionArtikel Article 2019
3Bartosik, M. ; Böhm, H.J. ; Krywka, C. ; Zhang, Z.L. ; Mayrhofer, P.H. Influence of Phase Transformation on the Damage Tolerance of Ti-Al-N CoatingsArtikel Article 2018
4Zalesak, J. ; Bartosik, M. ; Daniel, R. ; Mitterer, C. ; Krywka, C. ; Kiener, D. ; Mayrhofer, P.H. ; Keckes, J. Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin filmArtikel Article 2016
5Hollerweger, R. ; Holec, D. ; Paulitsch, J. ; Bartosik, M. ; Daniel, R. ; Rachbauer, R. ; Polcik, P. ; Keckes, J. ; Krywka, C. ; Euchner, H. ; Mayrhofer, P.H. Complementary ab initio and X-ray nanodiffraction studies of Ta2O5Artikel Article 2015
6Bartosik, M. ; Arndt, M. ; Rachbauer, R. ; Krywka, C. ; Koller, C.M. ; Keckes, J. ; Mayrhofer, P.H. Cross-sectional X-ray nano-diffraction and -reflectivity analysis of multilayered AlTiN-TiSiN thin films: Correlation between residual strain and bi-layer periodArtikel Article2015