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Todt, J.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Todt, J. ; Krywka, C. ; Zhang, Z.L. ; Mayrhofer, P.H. ; Keckes, J. ; Bartosik, M. Indentation response of a superlattice thin film revealed by in-situ scanning X-ray nanodiffractionArtikel Article 2020
2Saghaeian, F. ; Lederer, M. ; Hofer, A. ; Todt, J. ; Keckes, J. ; Khatibi, G. Investigation of high cyclic fatigue behaviour of thin copper films using MEMS structureArtikel Article 2019