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Deutschmann, B.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Büchl, D. ; Kemmetmüller, W. ; Glück, T. ; Deutschmann, B. ; Kugi, A.	A dynamic model of power metal-oxide-semiconductor field-effect transistor half-bridges for the fast simulation of switching induced electromagnetic emissions	Artikel Article	2019