Full name Familienname, Vorname
Reiner, M.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Ostermaier, C. ; Lagger, P. ; Reiner, M. ; Pogany, D. Review of bias-temperature instabilities at the III-N/dielectric interfaceArtikel Article 2018
2Lagger, P. ; Steinschifter, P. ; Reiner, M. ; Stadtmüller, M. ; Denifl, G. ; Naumann, A. ; Müller, J. ; Wilde, L. ; Sundqvist, J. ; Pogany, D. ; Ostermaier, C. Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stressArtikel Article 2014