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Powell, C. J.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Powell, C. J. ; Werner, W. S. M. ; Kalbe, H. ; Shard, A. G. ; Castner, D. G. Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core−Shell Nanoparticles by X‑ray Photoelectron SpectroscopyArtikel Article 2018
2Powell, C. J. ; Werner, W. S. M. ; Shard, A. G. ; Castner, D. G. Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy
Artikel Article 2016
3Chudzicki, M. ; Werner, W. S. M. ; Shard, A. G. ; Wang, Y.-C. ; Castner, D. G. ; Powell, C. J. Correction to "Evaluating the Internal Structure of Core-Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra"Artikel Article 2016
4Powell, C. J. ; Werner, W. S. M. ; Smekal, W. ; Tasneem, G. Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on siliconArtikel Article2013
5Powell, C. J. ; Werner, W. S. M. ; Smekal, W. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2011