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Niang, K. M.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Niang, K. M. ; Bayer, B. C. ; Meyer, J. C. ; Flewitt, A. J.	Highly Stable Amorphous Zinc Tin Oxynitride Thin Film Transistors under Positive Bias Stress	Artikel Article	2017