Full name Familienname, Vorname
Daniel, R.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Zalesak, J. ; Bartosik, M. ; Daniel, R. ; Mitterer, C. ; Krywka, C. ; Kiener, D. ; Mayrhofer, P.H. ; Keckes, J. Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin filmArtikel Article 2016
2Hollerweger, R. ; Holec, D. ; Paulitsch, J. ; Bartosik, M. ; Daniel, R. ; Rachbauer, R. ; Polcik, P. ; Keckes, J. ; Krywka, C. ; Euchner, H. ; Mayrhofer, P.H. Complementary ab initio and X-ray nanodiffraction studies of Ta2O5Artikel Article 2015
3Bartosik, M. ; Daniel, R. ; Mitterer, C. ; Matko, I. ; Burghammer, M. ; Mayrhofer, P.H. ; Keckes, J. Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNâ‚“ thin filmArtikel Article2013