Seebauer, S., Stöger-Pollach, M., Bernardi, J., Cerva, H., & Eibl, O. (2022). Quantitative chemical analysis of the γ- and γ’-phases in nickel base superalloy PWA1483. In 12th ASEM workshop on Advanced Electron Microscopy (pp. 17–17). Center for Surface and Nanoanalytics, JKU Linz. https://doi.org/10.34726/4321 ( reposiTUm)

Pongratz, P., Kenda, A., Cerva, H., & Hierlemann, M. (2006). Simulation of LACBED patterns of STI Structures for the Measurement of Strain in ULSI Devices. In J. Luitz (Ed.), DFTEM 2006 - bringing together two communities (pp. 203–206). http://hdl.handle.net/20.500.12708/44322 ( reposiTUm)

Kenda, A., Cerva, H., Pongratz, P., Hierlemann, M., & Liebmann, R. (2005). Strain measurements of ULSI devices using LACBED with TSUPREM modeled displacements. In A. G. Cullis & J. L. Hutchison (Eds.), Proceedings of the 14th Microscopy of Semiconducting Materials Conference (pp. 437–440). http://hdl.handle.net/20.500.12708/44321 ( reposiTUm)

Boxleitner, W., Hobler, G., Klüppel, V., & Cerva, H. (2000). Dynamic simulation of topography evolution and damage formation in TEM sample preparation using focused ion beams. 12th International Conference Ion Beam Modification of Materials, Gramado-Canela, Brasil, Austria. http://hdl.handle.net/20.500.12708/87713 ( reposiTUm)