Kosik, R., Cervenka, J., & Kosina, H. (2021). Numerical Constraints and Non‑Spatial Open Boundary Conditions for the Wigner Equation. Journal of Computational Electronics, 20(6), 2052–2061. https://doi.org/10.1007/s10825-021-01800-w ( reposiTUm)

Cervenka, J., Kosik, R., & Nedjalkov, M. (2021). A Deterministic Wigner Approach for Superposed States. Journal of Computational Electronics, 20(6), 2104–2110. https://doi.org/10.1007/s10825-021-01801-9 ( reposiTUm)

Illarionov, Yu. Yu., Vexler, M. I., Karner, M., Tyaginov, S. E., Cervenka, J., & Grasser, T. (2015). TCAD Simulation of Tunneling Leakage Current in CaF2/Si(111) MIS Structures. Current Applied Physics, 15(2), 78–83. https://doi.org/10.1016/j.cap.2014.10.015 ( reposiTUm)

Tyaginov, S. E., Illarionov, Yu. Yu., Vexler, M. I., Bina, M., Cervenka, J., Franco, J., Kaczer, B., & Grasser, T. (2014). Modeling of Deep-Submicron Silicon-Based MISFETs with Calcium Fluoride Dielectric. Journal of Computational Electronics, 13(3), 733–738. https://doi.org/10.1007/s10825-014-0593-9 ( reposiTUm)

Vasicek, M., Cervenka, J., Esseni, D., Palestri, P., & Grasser, T. (2012). Applicability of Macroscopic Transport Models to Decananometer MOSFETs. IEEE Transactions on Electron Devices, 59(3), 639–646. https://doi.org/10.1109/ted.2011.2181177 ( reposiTUm)

Starkov, I., Tyaginov, S., Enichlmair, H., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Ceric, H., & Grasser, T. (2011). Hot-Carrier Degradation Caused Interface State Profile-Simulation versus Experiment. Journal of Vacuum Science & Technology B, 29(1), 01AB09. https://doi.org/10.1116/1.3534021 ( reposiTUm)

Cervenka, J., Kosina, H., Selberherr, S., Zhang, J., Hrauda, N., Stangl, J., Bauer, G., Vastola, G., Marzegalli, A., Montalenti, F., & Miglio, L. (2011). Strained MOSFETs on Ordered SiGe Dots. Solid-State Electronics, 65–66, 81–87. https://doi.org/10.1016/j.sse.2011.06.041 ( reposiTUm)

Tyaginov, S. E., Starkov, I., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Enichlmair, H., Karner, M., Kernstock, C., Seebacher, E., Minixhofer, R., Ceric, H., & Grasser, T. (2010). Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling. Microelectronics Reliability, 50, 1267–1272. http://hdl.handle.net/20.500.12708/168176 ( reposiTUm)

Ceric, H., de Orio, R. L., Cervenka, J., & Selberherr, S. (2009). A Comprehensive TCAD Approach for Assessing Electromigration Reliability of Modern Interconnects. IEEE Transactions on Device and Materials Reliability, 9(1), 9–19. https://doi.org/10.1109/tdmr.2008.2000893 ( reposiTUm)

Cervenka, J., Ceric, H., & Selberherr, S. (2008). Three-Dimensional Simulation of Sacrificial Etching. Microsystem Technologies, 14(4–5), 665–671. https://doi.org/10.1007/s00542-007-0491-1 ( reposiTUm)

Vasicek, M., Cervenka, J., Wagner, M., Karner, M., & Grasser, T. (2008). A 2D Non-Parabolic Six-Moments Model. Solid-State Electronics, 52(10), 1606–1609. https://doi.org/10.1016/j.sse.2008.06.010 ( reposiTUm)

Vasicek, M., Cervenka, J., Wagner, M., Karner, M., & Grasser, T. (2008). Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs. Journal of Computational Electronics, 7(3), 168–171. https://doi.org/10.1007/s10825-008-0239-x ( reposiTUm)

Wagner, M., Karner, M., Cervenka, J., Vasicek, M., Kosina, H., Holzer, S., & Grasser, T. (2007). Quantum Correction for DG MOSFETs. Journal of Computational Electronics, 5(4), 397–400. https://doi.org/10.1007/s10825-006-0032-7 ( reposiTUm)

Cervenka, J., Wessner, W., Al-Ani, E., Grasser, T., & Selberherr, S. (2006). Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25(10), 2118–2128. https://doi.org/10.1109/tcad.2006.876514 ( reposiTUm)

Wessner, W., Cervenka, J., Heitzinger, C., Hossinger, A., & Selberherr, S. (2006). Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 25(10), 2129–2139. https://doi.org/10.1109/tcad.2005.862750 ( reposiTUm)

Cervenka, J., Kosik, R., & Senra Ribeiro, F. (2023). Parallel Solution of the Schrödinger-Poisson Equation on GPUs. In 14th International Conference on Large-Scale Scientific Computations (LSSC ’23): Scientific Program: Abstracts: List of Participants (pp. 34–35). ( reposiTUm)

Kosik, R., Cervenka, J., Waldhör, D., Ribeiro, F., & Kosina, H. (2023). Exploring the Global Solution Space of a Simple Schrödinger-Poisson Problem. In Large-Scale Scientific Computations (pp. 472–480). https://doi.org/10.1007/978-3-031-56208-2_49 ( reposiTUm)

Cervenka, J., Kosik, R., & Ribeiro, F. (2023). Parallel Solution of the Schrödinger-Poisson Equation on GPUs. In Large-Scale Scientific Computations (pp. 375–382). https://doi.org/10.1007/978-3-031-56208-2_38 ( reposiTUm)

Kosik, R., Cervenka, J., & Kosina, H. (2021). Open Boundary Conditions for the Wigner and the Characteristic von Neumann Equation. In Book of Abstracts of the International Wigner Workshop (IW2) (pp. 42–43). Institute for Microelectronics, TU Wien. http://hdl.handle.net/20.500.12708/77395 ( reposiTUm)

Kosik, R., Cervenka, J., & Kosina, H. (2020). Numerical Solution of the Constrained Wigner Equation. In 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan. IEEE. https://doi.org/10.23919/sispad49475.2020.9241624 ( reposiTUm)

Kosik, R., Cervenka, J., Thesberg, M., & Kosina, H. (2020). A Revised Wigner Function Approach for Stationary Quantum Transport. In I. Lirkov & S. Margenov (Eds.), Large-Scale Scientific Computing (pp. 403–410). Springer International Publishing. https://doi.org/10.1007/978-3-030-41032-2_46 ( reposiTUm)

Cervenka, J., & Weinbub, J. (2019). Superposed States and the Wigner Approach. In Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC) (p. 50). http://hdl.handle.net/20.500.12708/76637 ( reposiTUm)

Cervenka, J., & Filipovic, L. (2017). Numerical Aspects of the Deterministic Solution of the Wigner Equation. In Book of Abstracts of the International Wigner Workshop (IW2) (pp. 42–43). Institute for Microelectronics, TU Wien. http://hdl.handle.net/20.500.12708/75676 ( reposiTUm)

Cervenka, J., Ellinghaus, P., Nedjalkov, M., & Langer, E. (2015). Optimization of the Deterministic Solution of the Discrete Wigner Equation. In I. Lirkov, S. Margenov, & J. Waśniewski (Eds.), Large-Scale Scientific Computing (pp. 269–276). Springer International Publishing. https://doi.org/10.1007/978-3-319-26520-9_29 ( reposiTUm)

Cervenka, J., & Ellinghaus, P. (2015). Preconditioned Deterministic Solver for the Wigner Equation. In Abstracts International Conference on Large-Scale Scientific Computations (LSSC) (p. 31). http://hdl.handle.net/20.500.12708/74596 ( reposiTUm)

Cervenka, J., Ellinghaus, P., & Nedjalkov, M. (2014). Deterministic Solution of the Discrete Wigner Equation. In Eighth International Conference on Numerical Methods and Applications (p. 36). http://hdl.handle.net/20.500.12708/74187 ( reposiTUm)

Cervenka, J., Steinmair, A., Park, J. M., Seebacher, E., & Grasser, T. (2012). TCAD Simulations of Statistical Process Variations for High-Voltage LDMOS Transistors. In Proceedings of the 3rd European Workshop on CMOS Variability (p. 4). http://hdl.handle.net/20.500.12708/72893 ( reposiTUm)

Filipovic, L., Ceric, H., Cervenka, J., & Selberherr, S. (2011). A simulator for local anodic oxidation of silicon surfaces. In 2011 24th Canadian Conference on Electrical and Computer Engineering(CCECE). IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), Saskatoon, SK, Canada, Non-EU. https://doi.org/10.1109/ccece.2011.6030543 ( reposiTUm)

Weinbub, J., Cervenka, J., Rupp, K., & Selberherr, S. (2011). High-quality mesh generation based on orthogonal software modules. In 2011 International Conference on Simulation of Semiconductor Processes and Devices. 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Osaka, Japan. IEEE. https://doi.org/10.1109/sispad.2011.6035078 ( reposiTUm)

Weinbub, J., Cervenka, J., Rupp, K., & Selberherr, S. (2011). A Generic High-Quality Meshing Framework. In Proceedings of the 11th US National Congress on Computational Mechanics (USNCCM) (p. 1). http://hdl.handle.net/20.500.12708/72226 ( reposiTUm)

Starkov, I., Tyaginov, S. E., Enichlmair, H., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Ceric, H., & Grasser, T. (2010). HC Degradation Model: Interface State Profile-Simulations vs. Experiment. In Book of Abstracts (p. 128). http://hdl.handle.net/20.500.12708/71605 ( reposiTUm)

Tyaginov, S. E., Starkov, I., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Enichlmair, H., Karner, M., Kernstock, C., Seebacher, E., Minixhofer, R., Ceric, H., & Grasser, T. (2010). Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling. In Proceedings of the 21#^{st} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (p. 3). http://hdl.handle.net/20.500.12708/71660 ( reposiTUm)

Starkov, I., Tyaginov, S. E., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Enichlmair, H., Karner, M., Kernstock, C., Seebacher, E., Minixhofer, R., Ceric, H., & Grasser, T. (2010). Analysis of Worst-Case Hot-Carrier Conditions for High Voltage Transistors Based on Full-Band Monte-Carlo Simulations. In Proceedings of the 17#^{th} International Symposium on the Physical & Failure Analysis of Integrated Circuits (pp. 139–144). http://hdl.handle.net/20.500.12708/71855 ( reposiTUm)

Tyaginov, S. E., Starkov, I., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J. M., Enichlmair, H., Karner, M., Kernstock, C., Seebacher, E., Minixhofer, R., Ceric, H., & Grasser, T. (2010). Hot-Carrier Degradation Modeling Using Full-Band Monte-Carlo Simulations. In Proceedings of the 17#^{th} International Symposium on the Physical & Failure Analysis of Integrated Circuits (pp. 341–345). http://hdl.handle.net/20.500.12708/71857 ( reposiTUm)

Cervenka, J., Kosina, H., Selberherr, S., Zhang, J., Hrauda, N., Stangl, J., Bauer, G., Vastola, G., Marzegalli, A., & Miglio, L. (2010). Strained MOSFETs on Ordered SiGe Dots. In Proceedings of the European Solid-State Device Research Conference (ESSDERC) (pp. 297–300). http://hdl.handle.net/20.500.12708/71877 ( reposiTUm)

Vasicek, M., Sverdlov, V., Cervenka, J., Grasser, T., Kosina, H., & Selberherr, S. (2010). Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models. In I. Lirkov, S. Margenov, & J. Waśniewski (Eds.), Large-Scale Scientific Computing: 7th International Conference, LSSC 2009 (pp. 443–450). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-12535-5_52 ( reposiTUm)

Sverdlov, V., Vasicek, M., Cervenka, J., Grasser, T., Kosina, H., & Selberherr, S. (2009). Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models. In Abstracts of the International Conference on Large-Scale Scientific Computations (LSSC) (p. 93). http://hdl.handle.net/20.500.12708/71598 ( reposiTUm)

Orio, R., Ceric, H., Cervenka, J., & Selberherr, S. (2009). The Effect of Microstructure on Electromigration-Induced Failure Development. In ECS Transactions (pp. 345–352). http://hdl.handle.net/20.500.12708/71020 ( reposiTUm)

Orio, R., Ceric, H., Cervenka, J., & Selberherr, S. (2009). Electromigration Failure Development in Modern Dual-Damascene Interconnects. In Proceedings of the International Conference on Very Large Scale Integration (VLSI-SoC) (p. 5). http://hdl.handle.net/20.500.12708/70971 ( reposiTUm)

de Orio, R. L., Ceric, H., Cervenka, J., & Selberherr, S. (2009). The Effect of Copper Grain Size Statistics on the Electromigration Lifetime Distribution. In 2009 International Conference on Simulation of Semiconductor Processes and Devices. 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Diego, CA, United States of America (the). IEEE. https://doi.org/10.1109/sispad.2009.5290219 ( reposiTUm)

Ceric, H., de Orio, R. L., Cervenka, J., & Selberherr, S. (2009). Copper Microstructure Impact on Evolution of Electromigration Induced Voids. In 2009 International Conference on Simulation of Semiconductor Processes and Devices. 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Diego, CA, United States of America (the). IEEE. https://doi.org/10.1109/sispad.2009.5290222 ( reposiTUm)

Orio, R., Ceric, H., Cervenka, J., & Selberherr, S. (2009). The Effect of Microstructure on the Electromigration Lifetime Distribution. In Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2009) (pp. 731–734). http://hdl.handle.net/20.500.12708/70880 ( reposiTUm)

Ceric, H., Orio, R., Cervenka, J., & Selberherr, S. (2009). The Effect of Microstructure on Electromigration Induced Voids. In Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (pp. 694–697). http://hdl.handle.net/20.500.12708/71257 ( reposiTUm)

Schwaha, P., Cervenka, J., Nedjalkov, M., Gurov, T., Arsov, G., Misev, A., Zoric, A., & Ilic, S. (2009). Computational Electronics on GRID: A Mixed Mode Carrier Transport Model. In AIP Conference Proceedings. International Conference On Applications Of Mathematics In Technical And Natural Sciences, Sozopol (Bulgaria), Non-EU. https://doi.org/10.1063/1.3265331 ( reposiTUm)

Cervenka, J., & Selberherr, S. (2008). Analysis of microstructure impact on electromigration. In 2008 International Conference on Simulation of Semiconductor Processes and Devices. 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kanagawa, Japan. IEEE. https://doi.org/10.1109/sispad.2008.4648282 ( reposiTUm)

Vasicek, M., Cervenka, J., Karner, M., & Grasser, T. (2008). Consistent higher-order transport models for SOI MOSFETs. In 2008 International Conference on Simulation of Semiconductor Processes and Devices. 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kanagawa, Japan. IEEE. https://doi.org/10.1109/sispad.2008.4648254 ( reposiTUm)

Ceric, H., Orio, R., Cervenka, J., & Selberherr, S. (2008). Stress-Induced Anisotropy of Electromigration in Copper Interconnects. In Proceedings of the Stress-Induced Phenomena in Metallization: 10#^{th} International Workshop (pp. 56–62). http://hdl.handle.net/20.500.12708/70895 ( reposiTUm)

Ceric, H., Orio, R., Cervenka, J., & Selberherr, S. (2008). TCAD Solutions for Submicron Copper Interconnect. In Proceedings 15#^{th} International Symposium on the Physical and Failure Analysis of Integrated Circuits (pp. 78–81). http://hdl.handle.net/20.500.12708/70253 ( reposiTUm)

Vasicek, M., Cervenka, J., Wagner, M., Karner, M., & Grasser, T. (2007). A 2D-Non-Parabolic Six Moments Model. In 2007 International Semiconductor Device Research Symposium (p. 2). http://hdl.handle.net/20.500.12708/70048 ( reposiTUm)

Cervenka, J., Ceric, H., Ertl, O., & Selberherr, S. (2007). Three-Dimensional Sacrificial Etching. In T. Grasser & S. Selberherr (Eds.), Simulation of Semiconductor Processes and Devices 2007 (pp. 433–436). Springer-Verlag. https://doi.org/10.1007/978-3-211-72861-1_105 ( reposiTUm)

Vasicek, M., Cervenka, J., Karner, M., Wagner, M., & Grasser, T. (2007). Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs. In Book of Abstracts of the International Workshop on Computational Electronics (IWCE) (pp. 96–97). http://hdl.handle.net/20.500.12708/69802 ( reposiTUm)

Cervenka, J., Ceric, H., & Selberherr, S. (2007). Three-Dimensional Simulation of Sacrificial Etching. In T. Becker, C. Cané, & N. S. Barker (Eds.), Smart Sensors, Actuators, and MEMS III (pp. 452–460). SPIE. https://doi.org/10.1117/12.721979 ( reposiTUm)

Wittmann, R., Hössinger, A., Cervenka, J., Uppal, S., & Selberherr, S. (2006). Monte Carlo Simulation of Boron Implantation into (100) Germanium. In 2006 International Conference on Simulation of Semiconductor Processes and Devices. 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, California, United States of America (the). IEEE. https://doi.org/10.1109/sispad.2006.282914 ( reposiTUm)

Ceric, H., Cervenka, J., Langer, E., & Selberherr, S. (2006). Moving Boundary Applications in Process and Interconnect TCAD. In Proceedings Mini-Workshop on Anisotropic Motion Laws (pp. 13–16). http://hdl.handle.net/20.500.12708/69233 ( reposiTUm)

Wittmann, R., Uppal, S., Hössinger, A., Cervenka, J., & Selberherr, S. (2006). A Study of Boron Implantation into High Ge Content SiGe Alloys. In 210#^{th} ECS Meeting (p. 1). http://hdl.handle.net/20.500.12708/69293 ( reposiTUm)

Nentchev, A., Cervenka, J., Marnaus, G., Enichlmair, H., & Selberherr, S. (2006). Heatring - Smart Investigation of Temperature Impact on Integrated Circuit Devices. In Collection of Papers Presented at the 12#^{th} International Workshop on Thermal Investigation of ICs and Systems (pp. 235–238). http://hdl.handle.net/20.500.12708/69238 ( reposiTUm)

Wessner, W., Ceric, H., Cervenka, J., & Selberherr, S. (2005). Dynamic Mesh Adaptation for Three-Dimensional Electromigration Simulation. In 2005 International Conference On Simulation of Semiconductor Processes and Devices. 2005 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo, Japan. IEEE. https://doi.org/10.1109/sispad.2005.201494 ( reposiTUm)

Cervenka, J., Kosik, R., Vasicek, M.-T., Gritsch, M., Selberherr, S., & Grasser, T. (2023). Macroscopic Transport Models for Classical Device Simulation. In M. Rudan, R. Brunetti, & S. Reggiani (Eds.), Springer Handbook of Semiconductor Devices (pp. 1335–1381). Springer. https://doi.org/10.1007/978-3-030-79827-7_37 ( reposiTUm)

Cervenka, J., Ellinghaus, P., & Nedjalkov, M. (2015). Deterministic Solution of the Discrete Wigner Equation. In I. Dimov, S. Fidanova, & I. Lirkov (Eds.), Numerical Methods and Applications (pp. 149–156). Springer International Publishing. https://doi.org/10.1007/978-3-319-15585-2_17 ( reposiTUm)

Cervenka, J., Zoric, A., Gurov, T., & Arsov, G. (2010). GRINKO - Grid e-Infrastructure and Networking with Kosovo. In JOINT RESEARCH AND TECHNOLOGY DEVELOPMENT Projects 2007-2010 (pp. 150–162). KAIP. http://hdl.handle.net/20.500.12708/27196 ( reposiTUm)

Wittmann, R., Uppal, S., Hoessinger, A., Cervenka, J., & Selberherr, S. (2006). A Study of Boron Implantation into High Ge Content SiGe Alloys. In D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, & S. Zaima (Eds.), ECS Transactions (pp. 667–676). ECS Transactions. https://doi.org/10.1149/1.2355862 ( reposiTUm)

Ullmann, B., Grill, A., Manstetten, P., Jech, M., Kampl, M., Zisser, W., Filipovic, L., Thesberg, M., Rudolf, F., Windbacher, T., Cervenka, J., Katterbauer, M., & Weinbub, J. (2016). Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik. Lange Nacht der Forschung 2016, Wien, Austria. http://hdl.handle.net/20.500.12708/90775 ( reposiTUm)

Cervenka, J., Ceric, H., & Selberherr, S. (2007). Three-Dimensional Simulation of Sacrificial Etching. SPIE Smart Sensors, Actuators, and MEMS, Masapalomas, Spain, EU. http://hdl.handle.net/20.500.12708/88615 ( reposiTUm)

Lorenz, J., Clees, T., Bär, E., Jancke, R., Paschen, U., Lang, P., Salzig, C., Klaaßen, B., Hauser, M., & Cervenka, J. (2011). Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen. http://hdl.handle.net/20.500.12708/37772 ( reposiTUm)

Lorenz, J., Clees, T., Bär, E., Jancke, R., Paschen, U., Lang, P., Salzig, C., Klaaßen, B., Hauser, M., & Cervenka, J. (2010). Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen (No. M4). http://hdl.handle.net/20.500.12708/36770 ( reposiTUm)

Kosina, H., & Cervenka, J. (2010). MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems. http://hdl.handle.net/20.500.12708/36774 ( reposiTUm)

Lorenz, J., Clees, T., Bär, E., Jancke, R., Paschen, U., Lang, P., Salzig, C., Klaaßen, B., Hauser, M., & Cervenka, J. (2010). Hierarchische Simulation nanoelektronischer Systeme zur Beherrschung von Prozessschwankungen (No. M5). http://hdl.handle.net/20.500.12708/36772 ( reposiTUm)

Binder, T., Cervenka, J., Gehring, A., Harlander, C., Heitzinger, C., & Selberherr, S. (2001). VISTA Status Report June 2001. http://hdl.handle.net/20.500.12708/31431 ( reposiTUm)

Cervenka, J. (2004). Three-dimensional mesh Generation for device and process simulation [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2004.1458 ( reposiTUm)