Allegretta, I., Krstajic, D., Wobrauschek, P., Kregsamer, P., Ingerle, D., Streli, C., Porfido, C., & Terzano, R. (2024). Implementing light elements detection and quantification in aluminosilicate materials using a Low-Z total-reflection X-ray fluorescence spectrometer. Applied Clay Science, 251, Article 107326. https://doi.org/10.1016/j.clay.2024.107326 ( reposiTUm)

Wobrauschek, P., Ingerle, D., Prost, J., Dhara, S., Mishra, N. L., Iro, M., & Streli, C. (2023). A new compact micro‐XRF spectrometer with polychromatic x‐ray sample excitation. X-Ray Spectrometry. https://doi.org/10.1002/xrs.3412 ( reposiTUm)

Iro, M., Ingerle, D., Hampel Sven, Fittschen, U. E. A., Dhamgaye, V., Fox, O. J. L., & Streli, C. (2023). voxTrace: A voxel-based Monte-Carlo ray-tracing code for the simulation of X-ray fluorescence spectra. SoftwareX, 23, Article 101481. https://doi.org/10.1016/j.softx.2023.101481 ( reposiTUm)

Iro, M., Ingerle, D., Radtke, M., Guilherme Buzanich, A., Kregsamer, P., & Streli, C. (2022). Investigation of polycapillary half lenses for quantitative confocal micro-X-ray fluorescence analysis. Journal of Synchrotron Radiation, 29(6), 1376–1384. https://doi.org/10.1107/S1600577522009699 ( reposiTUm)

Borgese, L., Bilo, F., Zacco, A., Federici, S., Mutahi, A. W., Bontempi, E., Trzepla, K., Hyslop, N., Yatkin, S., Wobrauschek, P., Prost, J., Ingerle, D., & Depero, L. E. (2020). The assessment of a method for measurements and lead quantification in air particulate matter using total reflection X-ray fluorescence spectrometers. Spectrochimica Acta Part B: Atomic Spectroscopy, 167(105840), 105840. https://doi.org/10.1016/j.sab.2020.105840 ( reposiTUm)

Ingerle, D., Swies, J., Iro, M., Wobrauschek, P., Streli, C., & Hradil, K. (2020). A monochromatic confocal micro-x-ray fluorescence (μXRF) spectrometer for the lab. Review of Scientific Instruments, 91(12), 123107. https://doi.org/10.1063/5.0028830 ( reposiTUm)

Ingerle, D., Artner, W., Hradil, K., & Streli, C. (2020). Refitting an X-ray diffraction system for combined GIXRF and XRR measurements. Powder Diffraction, 35(S1), S29–S33. https://doi.org/10.1017/s088571562000041x ( reposiTUm)

Streli, C., Rauwolf, M., Turyanskaya, A., Ingerle, D., & Wobrauschek, P. (2019). Elemental imaging of trace elements in bone samples using micro and nano- X-ray fluorescence spectrometry. Applied Radiation and Isotopes, 149, 200–205. https://doi.org/10.1016/j.apradiso.2019.04.033 ( reposiTUm)

Perneczky, L., Rauwolf, M., Ingerle, D., Eichert, D., Brigidi, F., Jark, W., Bjeoumikhova, S., Pepponi, G., Wobrauschek, P., Streli, C., & Turyanskaya, A. (2018). Temporary implementation and testing of a confocal SR-μXRF system forbone analysis at the X-ray Fluorescence beamline at Elettra. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 897, 114–119. https://doi.org/10.1016/j.nima.2018.04.012 ( reposiTUm)

Gaál, A., Orgován, G., Mihucz, V. G., Pape, I., Ingerle, D., Streli, C., & Szoboszlai, N. (2018). Metal transport capabilities of anticancer copper chelators. Journal of Trace Elements in Medicine and Biology, 47, 79–88. https://doi.org/10.1016/j.jtemb.2018.01.011 ( reposiTUm)

Maderitsch, A., Ingerle, D., Bretschneider, T., Rauwolf, M., Pflumm, C., Buchholz, H., Borchert, H., Streli, C., & Parisi, J. (2018). Analysis of organic multilayer structures using a combined grazing incidence X-ray fluorescence/X-ray reflectometry approach. Spectrochimica Acta Part B: Atomic Spectroscopy, 148, 188–192. https://doi.org/10.1016/j.sab.2018.07.006 ( reposiTUm)

Rauwolf, M., Turyanskaya, A., Ingerle, D., Szoboszlai, N., Pape, I., Malandain, A. W., Fox, O. J. L., Hahn, L., Sawhney, K. J. S., & Streli, C. (2018). Characterization of a submicro-X-ray fluorescence setup on the B16 beamline at Diamond Light Source. Journal of Synchrotron Radiation, 25(4), 1189–1195. https://doi.org/10.1107/s1600577518006203 ( reposiTUm)

Rotella, H., Caby, B., Ménesguen, Y., Mazel, Y., Valla, A., Ingerle, D., Detlefs, B., Lépy, M.-C., Novikova, A., Rodriguez, G., Streli, C., & Nolot, E. (2017). Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis. Spectrochimica Acta Part B: Atomic Spectroscopy, 135, 22–28. https://doi.org/10.1016/j.sab.2017.06.011 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Wobrauschek, P., & Streli, C. (2016). JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants. Spectrochimica Acta Part B: Atomic Spectroscopy, 118, 20–28. https://doi.org/10.1016/j.sab.2016.02.010 ( reposiTUm)

Mihucz, V. G., Meirer, F., Polgári, Z., Réti, A., Pepponi, G., Ingerle, D., Szoboszlai, N., & Streli, C. (2016). Iron overload of human colon adenocarcinoma cells studied by synchrotron‑based X‑ray techniques. JBIC Journal of Biological Inorganic Chemistry, 21(2), 241–249. https://doi.org/10.1007/s00775-015-1331-x ( reposiTUm)

Majer, Z., Bösze, S., Szabó, I., Mihucz, V. G., Gaál, A., Szilvágyi, G., Pepponi, G., Meirer, F., Wobrauschek, P., Szoboszlai, N., Ingerle, D., & Streli, C. (2015). Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorption. Microchemical Journal, 120, 51–57. https://doi.org/10.1016/j.microc.2015.01.002 ( reposiTUm)

Wobrauschek, P., Prost, J., Ingerle, D., Kregsamer, P., Misra, N. L., & Streli, C. (2015). A novel vacuum spectrometer for total reflection x-ray fluorescence analysis with two exchangeable low power x-ray sources for the analysis of low, medium, and high Z elements in sequence. Review of Scientific Instruments, 86(8), 083105. https://doi.org/10.1063/1.4928499 ( reposiTUm)

Caby, B., Brigidi, F., Ingerle, D., Nolot, E., Pepponi, G., Streli, C., Lutterotti, L., André, A., Rodriguez, G., Gergaud, P., Morales, M., & Chateigner, D. (2015). Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis. Spectrochimica Acta Part B: Atomic Spectroscopy, 113, 132–137. https://doi.org/10.1016/j.sab.2015.09.008 ( reposiTUm)

Ingerle, D., Meirer, F., Pepponi, G., Demenev, E., Giubertoni, D., Wobrauschek, P., & Streli, C. (2014). Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions. Spectrochimica Acta Part B: Atomic Spectroscopy, 99, 121–128. https://doi.org/10.1016/j.sab.2014.06.019 ( reposiTUm)

Rauwolf, M., Vanhoof, C., Tirez, K., Maes, E., Ingerle, D., Wobrauschek, P., & Streli, C. (2014). Total reflection X-ray fluorescence measurements of S and P in proteins using a vacuum chamber specially designed for low Z elements. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 101, 118–122. https://doi.org/10.1016/j.sab.2014.07.022 ( reposiTUm)

Ingerle, D., Schiebl, M., Streli, C., & Wobrauschek, P. (2014). Combination of grazing incidence x-ray fluorescence with x-ray reflectivity in one table-top spectrometer for improved characterization of thin layer and implants on/in silicon wafers. Review of Scientific Instruments, 85(8), 083110. https://doi.org/10.1063/1.4893383 ( reposiTUm)

Dhara, S., Misra, N. L., Aggarwal, S. K., Ingerle, D., Wobrauschek, P., & Streli, C. (2014). Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection x-ray fluorescence. X-Ray Spectrometry, 43, 108–111. http://hdl.handle.net/20.500.12708/156452 ( reposiTUm)

Polgári, Z., Meirer, F., Sasamori, S., Ingerle, D., Pepponi, G., Streli, C., Rickers, K., Réti, A., Budai, B., Szoboszlai, N., & Záray, G. (2011). Iron speciation in human cancer cells by K-edge Total Reflection X-ray Fluorescence-X-ray Absorption Near Edge Structure. Spectrochimica Acta Part B: Atomic Spectroscopy, 66, 274–279. https://doi.org/10.1016/j.sab.2011.03.011 ( reposiTUm)

Osán, J., Meirer, F., Groma, V., Török, S., Ingerle, D., Streli, C., & Pepponi, G. (2010). Speciation of copper and zinc in size-fractionated atmospheric particulate matter using total reflection mode X-ray absorption near-edge structure spectrometry. Spectrochimica Acta Part B: Atomic Spectroscopy, 65(12), 1008–1013. https://doi.org/10.1016/j.sab.2010.11.002 ( reposiTUm)

Ingerle, D., Meirer, F., Zoeger, N., Pepponi, G., Giubertoni, D., Steinhauser, G., Wobrauschek, P., & Streli, C. (2010). A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers. Spectrochimica Acta Part B: Atomic Spectroscopy, 65(6), 429–433. https://doi.org/10.1016/j.sab.2010.02.015 ( reposiTUm)

Pepponi, G., Giubertoni, D., Bersani, M., Meirer, F., Ingerle, D., Steinhauser, G., Streli, C., Hoenicke, P., & Beckhoff, B. (2010). Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon. Journal of Vacuum Science & Technology B, 28, C1C59-C1C64. http://hdl.handle.net/20.500.12708/166894 ( reposiTUm)

Ingerle, D., Meirer, F., Siebers, K., Wobrauschek, P., & Streli, C. (2025). GIMOXS: A Versatile GI/TXRF Spectrometer for Characterization of Nanomaterials in the Lab from C to U. In 20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods : September 9-12, 2025 Jan Kochanowski University, Kielce, Poland : Program and book of abstracts (pp. 36–36). ( reposiTUm)

Sauer, M., Rath, J., Foelske, A., & Ingerle, D. (2025). Thickness and Elemental Quantification of (Ultra)Thin Films Revisited. In AVS Quantum Science Workshop : Abstract Book (pp. 178–178). ( reposiTUm)

Wobrauschek, P., Ingerle, D., Ziegler, P., Krstajic, D., Müller, M., & Streli, C. (2025). Characterization of the ATI TXRF Spectrometer from the Detection of low Z Elements. In 20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods : September 9-12, 2025, Jan Kochanowski University, Kielce, Poland : Program and book of abstracts (pp. 60–60). ( reposiTUm)

Siebers, K., Jongeleen, E. S., Brouwer, A. C. M., Mandemaker, L., Weckhuysen, B., Ingerle, D., Wobrauschek, P., Streli, C., & Meirer, F. (2024). Improving Sample Preparation for Total Reflection X-ray Fluorescence by Selective Surface Functionalization. In A. Karydas (Ed.), EXRS 2024 book of abstracts (pp. 196–196). http://hdl.handle.net/20.500.12708/211079 ( reposiTUm)

Ingerle, D., Meirer, F., Siebers, K., Wobrauschek, P., & Streli, C. (2024). GIMOXS - a spectrometer for GIXRF and TXRF for the nondestructive characterization of nanomaterials including light elements in the laboratory. In A. Karydas (Ed.), EXRS 2024 : Book of Abstracts (pp. 199–199). http://hdl.handle.net/20.500.12708/211099 ( reposiTUm)

Polgari, Z., Szoboszlai, N., Meirer, F., Ingerle, D., Pepponi, G., Budai, B., Zaray, G., Appel, K., & Streli, C. (2011). Iron speciation in human cancer cell lines by K-edge SRTXRF-XANES. In HASYLAB, Annual Report 2010 (pp. 1–2). Hamburger Synchrotronstrahlungslabor HASYLAB. http://hdl.handle.net/20.500.12708/44625 ( reposiTUm)

Ingerle, D., Pepponi, G., Streli, C., & Wobrauschek, P. (2011). GIXRF and XRR characterization of near surface layers. In HASYLAB, Annual Report 2010 (pp. 1–2). Hamburger Synchrotronstrahlungslabor HASYLAB. http://hdl.handle.net/20.500.12708/44624 ( reposiTUm)

Ingerle, D., Ljubic Tobisch, V., Hradil, K., Wobrauschek, P., Streli, C., & Whitmore, K. (2024, August 10). Monochromatic Tube Excited microXF of Daguerreotypes [Conference Presentation]. Denver X-ray Conference  2024, Westminster, USA, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/209028 ( reposiTUm)

Frank, A., Cook, P. K., Hradil, K., Ingerle, D., Kerber, M., Lichtenegger, H., & Streli, C. (2024, June 26). Elemental Mapping using lab-based Full Field Fluorescence imaging [Conference Presentation]. European Conference on X-Ray Spectrometry (EXRS), Athens, Greece. http://hdl.handle.net/20.500.12708/208315 ( reposiTUm)

Kraus, P., Wobrauschek, P., Kregsamer, P., Streli, C., & Ingerle, D. (2024, August 10). MAXI- macro XRF Scanning Device with mm Spot Size for A4 Area Scans [Conference Presentation]. Denver X-ray Conference, 2024, Westminster,, US, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/209030 ( reposiTUm)

Ljubic Tobisch, V., Ingerle, D., Wobrauschek, P., Streli, C., Whitmore, K., & Hradil, K. (2024, June 28). Monochromatic tube excited microXRF of Daguerreotypes [Conference Presentation]. European X-ray Spectrometry Conference 2024, Athens, Greece. http://hdl.handle.net/20.500.12708/209562 ( reposiTUm)

Ingerle, D. (2023, August 8). Grazing X-ray techniques for the nondestructive characterization of layered materials [Presentation]. DXC DENVER X-RAY CONFERENCE, Lombard, United States of America (the). ( reposiTUm)

Allegretta, I., Krstajic, D., Wobrauschek, P., Kregsamer, P., Ingerle, D., Streli, C., Porfido, C., & Terzano, R. (2023, September 7). A new strategy for the quantification of light elements (F-Fe) in aluminosilicates via a Low-Z TXRF spectrometer [Conference Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188580 ( reposiTUm)

Siebers, K., Brouwer, A. C. M., Ingerle, D., Wobrauschek, P., Streli, C., & Meirer, F. (2023, September 5). Surface Functionalization for Advanced Sample Preparation in TXRF [Conference Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188573 ( reposiTUm)

Ingerle, D., Meirer, F., Siebers, K., Wobrauschek, P., & Streli, C. (2023, September 5). GIMOXS- a new spectrometer for GIXRF for the nondestructive characterization of light element containing nanomaterials in the laboratory [Poster Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188587 ( reposiTUm)

Ingerle, D. (2023, September 7). Glancing incidence X-ray analysis for nondestructive characterization of nanomaterials in the laboratory [Conference Presentation]. 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188574 ( reposiTUm)

Ziegler, P., Weinberger, M., Krstajic, D., Ingerle, D., Wobrauschek, P., & Streli, C. (2023, September 6). Tackling low Z element quantification with TXRF [Poster Presentation]. TXRF 2023: 19th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods, Clausthal, Germany. http://hdl.handle.net/20.500.12708/188722 ( reposiTUm)

Hampel, S., Mähler, F., Iro, M., Ingerle, D., Streli, C., Fox, O. J. L., Sawhney, K., & Fittschen, U. E. A. (2023, April 12). 3D printed metal containing polymer layers as reference samples in micro XRF analysis [Poster Presentation]. ANacon 2023, Wien, Austria. http://hdl.handle.net/20.500.12708/176781 ( reposiTUm)

Wobrauschek, P., Hradil, K., Ingerle, D., & Streli, C. (2023). XRF of Layered Structures [Conference Presentation]. Denver X-ray Conference 2023, Lombard, United States of America (the). ( reposiTUm)

Frank, A., Ingerle, D., Hradil, K., Streli, C., Cook, P., Lichtenegger, H., Kerber, M., & Hartmann, R. (2023, August 9). First Results with the X-ray Color Camera Microscope [Conference Presentation]. Denver X-Ray Conference, Chicago, United States of America (the). http://hdl.handle.net/20.500.12708/189876 ( reposiTUm)

Bretschneider, T., Rauwolf, M., Ingerle, D., Wobrauschek, P., & Streli, C. (2022, June 28). Characterization of light element nanolayers by GIXRF in combination with JGIXA software [Poster Presentation]. EXRS 2022 - European X-ray Spectrometry Conference, Brügge, Belgium. ( reposiTUm)

Iro, M., Ingerle, D., Kregsamer, P., Wobrauschek, P., & Streli, C. (2022, August 4). Steps towards the quantitative interpretation of confocal micro-X-ray fluorescence measurements (QCMXRF) [Conference Presentation]. Denver X-ray conference 2022, Bethesda, United States of America (the). ( reposiTUm)

Iro, M., Ingerle, D., Wobrauschek, P., & Streli, C. (2022, 0 0). Steps towards quantitative confocal micro X-ray fluorescence analysis (QCMXRF) [Conference Presentation]. EXRS Conference, Brügge, Belgium. ( reposiTUm)

Iro, M., Ingerle, D., & Streli, C. (2022, June 28). jGiXa 2.0 and further advances in GIXA Software [Poster Presentation]. EXRS 2022 - European X-ray Spectrometry Conference, Brügge, Belgium. ( reposiTUm)

Ingerle, D. (2022, August 1). Workshop Layered structures: GIXA [Conference Presentation]. Denver X-ray conference, Rockville, Maryland, United States of America (the). ( reposiTUm)

Ingerle, D., Iro, M., Hradil, K., Swies, J., Streli, C., & Wobrauschek, P. (2022, 0 0). A monochromatic confocal micro X-ray Fluorescence (µXRF) spectrometer using polycapillaries for the lab [Conference Presentation]. EXRS2022, Brügge, Belgium. ( reposiTUm)

Ingerle, D., Iro, M., Hradil, K., Swies, J., Wobrauschek, P., & Streli, C. (2022, June 29). A monochromatic confocal micro X-ray Fluorescence (μXRF) spectrometer using polycapillaries for the lab [Conference Presentation]. EXRS 2022 - European X-ray Spectrometry Conference, Brügge, Belgium. http://hdl.handle.net/20.500.12708/136310 ( reposiTUm)

Allegretta, I., Krstajic, D., Wobrauschek, P., Kregsamer, P., Ingerle, D., Streli, C., & Terzano, R. (2022). Direct analysis of light elements in aluminosilicates using a Low-Z TXRF spectrometer [Conference Presentation]. EXRS 2022, Brügge, Belgium. http://hdl.handle.net/20.500.12708/80636 ( reposiTUm)

Ingerle, D., Meirer, F., Wobrauschek, P., & Streli, C. (2021). GIXRF for the nondestructive characterization of light element containing nanomaterials in the laboratory. 70th Annual Denver X-ray conference, Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135452 ( reposiTUm)

Ingerle, D., Meirer, F., Wobrauschek, P., & Streli, C. (2021). Nondestructive characterization of light elements in nanomaterials with GIXRF in the laboratory. Online Conference: 1st virtual conference in X-ray spectrometry EXSA’s 2021 online event, Budapest, online, Hungary. http://hdl.handle.net/20.500.12708/135436 ( reposiTUm)

Ingerle, D. (2021). Grazing X-ray techniques for the nondestructive characterization of layered materials. 70th Annual Denver X-ray conference, Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135450 ( reposiTUm)

Streli, C., Ingerle, D., Rachbauer, L., Bretschneider, T., Prost, J., & Wobrauschek, P. (2021). Determination of light elements down to Carbon using TXRF. Online Conference: Enforce TXRF (COST action CA18130) BIOMEDIAG Subgroup Workshop (2021), Krakow, Poland. http://hdl.handle.net/20.500.12708/135457 ( reposiTUm)

Wobrauschek, P., Ingerle, D., Prost, J., Dhara, S., Misra, N. L., Iro, M., & Streli, C. (2021). F-9 Comparison of a Compact Table Top Micro-XRF Spectrometer With Low Power Rh Target Tube Excitation With a Monochromatic Micro-XRF Spectrometer With Mo Excitation. 70th Annual Denver X-ray conference, Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135454 ( reposiTUm)

Iro, M., Ingerle, D., Streli, C., Tsuji, K., Hampel, S., Lutz, C., & Fittschen, U. (2021). F-07 STUDENT Investigation of the Transmission Properties of a Polycapillary Half-Lens and Their Effect on Quantification For Confocal µXRF. 70th Annual Denver X-ray conference, Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135455 ( reposiTUm)

Ingerle, D., Wobrauschek, P., Streli, C., & Hradil, K. (2020). A Monochromatic Confocal micro X-ray Fluorescence (µXRF) Spectrometer using Polycapillaries for the Lab. Online Conference: Denver X-ray conference (2020), Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135331 ( reposiTUm)

Streli, C., Ingerle, D., & Wobrauschek, P. (2020). Characterization of Nanomaterials with Combined GIXRF and XRR Approach. Denver X-ray conference (2020), Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135333 ( reposiTUm)

Fittschen, U., Till, H. S., Hampel, S., Gross, A., Kulow, A., Buzanich, G., Reinholz, U., Radtke, M., Ingerle, D., & Streli, C. (2020). Improving Surface Sensitive XRF Using Ink-Jet Printing and Information from the Angle Dependent Signal. Denver X-ray conference (2020), Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135334 ( reposiTUm)

Ingerle, D. (2020). Workshop on trace analysis: Micro-XRF. Denver X-ray conference (2020), Denver, United States of America (the). http://hdl.handle.net/20.500.12708/135330 ( reposiTUm)

Wobrauschek, P., Prost, J., Ingerle, D., Osan, J., Török, S., & Streli, C. (2019). Adaption of a TXRF WOBI-module with a low power X-ray tube. 18th TXRF Conference 2019, Girona, Spain. http://hdl.handle.net/20.500.12708/134692 ( reposiTUm)

Ingerle, D., Pepponi, G., Wobrauschek, P., & Streli, C. (2019). Combined GIXRF and XRR analysis (GIXA) of nanomaterials in the laboratory. 18th TXRF Conference 2019, Girona, Spain. http://hdl.handle.net/20.500.12708/134691 ( reposiTUm)

Gaál, A., Varga, Z., Ingerle, D., Streli, C., & Szoboszlai, N. (2019). Targeting antitumor copper complexes and imaging using synchrotron radiation at the cellular level. 17th International Congress on Photobiology 18th Congress of the European Society for Photobiology (2019), Barcelona, Spain. http://hdl.handle.net/20.500.12708/134840 ( reposiTUm)

Rauwolf, M., Wanzenböck, R., Turyanskaya, A., Ingerle, D., Buzanich, G., Lang, S., Windhager, R., Radtke, M., Hofstätter, J., Roschger, A., Roschger, P., Sprio, S., Preti, L., Tampieri, A., & Streli, C. (2019). Determination of the Oxidation State of Zinc and Strontium in Mineralized Osteosarcoma Tissue by in Micro X-ray Fluorescence XANES. 68th Annual Denver X-Ray Conference (2019), Illinois, United States of America (the). http://hdl.handle.net/20.500.12708/134833 ( reposiTUm)

Ingerle, D., Wobrauschek, P., Streli, C., & Hradil, K. (2019). First Results from a Monochromatic Confocal Micro X-ray Fluorescence (μXRF) Spectrometer for the Lab. 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25) (2019), Illinois, United States of America (the). http://hdl.handle.net/20.500.12708/134834 ( reposiTUm)

Wobrauschek, P., Ingerle, D., Prost, J., Streli, C., Dhara, S., & Misra, N. L. (2019). Compact Table Top micro-XRF Spectrometer with Low Power Rh Target Tube Excitation. 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25) (2019), Illinois, United States of America (the). http://hdl.handle.net/20.500.12708/134835 ( reposiTUm)

Streli, C., Rauwolf, M., Turyanskaya, A., Ingerle, D., & Wobrauschek, P. (2019). Elemental Imaging of Trace Elements in Bone Samples. 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25) (2019), Illinois, United States of America (the). http://hdl.handle.net/20.500.12708/134836 ( reposiTUm)

Ingerle, D., Wobrauschek, P., Streli, C., & Pepponi, G. (2019). Combined GIXRF and XRR Analysis (GIXA) for the Nondestructive Characterization of Nanomaterials in the Laboratory. 25th International Congress on X-ray Optics and Microanalysis (ICXOM-25) (2019), Illinois, United States of America (the). http://hdl.handle.net/20.500.12708/134837 ( reposiTUm)

Streli, C., Ingerle, D., Iro, M., Pepponi, G., & Wobrauschek, P. (2019). Characterization of nanomaterials using GIXRF with XRR using lab sources. PRORA 2019, Berlin, Germany. http://hdl.handle.net/20.500.12708/134920 ( reposiTUm)

Streli, C., Rauwolf, M., Turyanskaya, A., Ingerle, D., & Wobrauschek, P. (2018). X-ray spectrometry of biological material. Seminar, Paris, France. http://hdl.handle.net/20.500.12708/133929 ( reposiTUm)

Ingerle, D., Walchhofer, P., Bretschneider, T., Maderitsch, A., & Streli, C. (2018). Quantification of layers and implants using GIXRF in combination with TXRF standards. EXRS - 2018/European Conference on X-Ray Spectrometry, Ljubljana, Slovenia. http://hdl.handle.net/20.500.12708/134086 ( reposiTUm)

Streli, C., Ingerle, D., & Wobrauschek, P. (2018). X-ray fluorescence spectrometry and grazing incidence XRF. 2nd Workshop Materials Characterisation by the Combined Analysis and Raw Materials Applications Day (2018), Trento, Italy. http://hdl.handle.net/20.500.12708/134260 ( reposiTUm)

Streli, C., Rauwolf, M., Turyanskaya, A., Ingerle, D., & Wobrauschek, P. (2018). Elemental imaging of trace elements in bone samples. XVI Conferencia Latinoamericana de analisis por tecnicas de rayos X, Pucon, Chile. http://hdl.handle.net/20.500.12708/134234 ( reposiTUm)

Wobrauschek, P., Ingerle, D., Prost, J., & Streli, C. (2018). TXRF of airborne particulate matter and GIXRF of nano-layers. XVI Conferencia Latinoamericana de analisis por tecnicas de rayos X, Pucon, Chile. http://hdl.handle.net/20.500.12708/134233 ( reposiTUm)

Rauwolf, M., Turyanskaya, A., Ingerle, D., Streli, C., Szoboszlai, N., Pape, I., Malandain, A. W., Fox, O. J. L., Sawhney, K., & Hahn, L. (2018). The Submicro-X-ray Fluorescence Setup on the B16 Beamline at Diamond Light Source. Denver X-ray conference (2018), Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/134144 ( reposiTUm)

Ingerle, D. (2018). Grazing X-ray techniques for the nondestructive characterization of nanomaterials. X-ray metrology workshop 2018, Utrecht, Netherlands (the). http://hdl.handle.net/20.500.12708/134051 ( reposiTUm)

Wobrauschek, P., Ingerle, D., & Streli, C. (2018). Total reflection X-ray fluorescence and X-ray standing wave workshop. X-ray metrology workshop 2018, Utrecht, Netherlands (the). http://hdl.handle.net/20.500.12708/131837 ( reposiTUm)

Streli, C., Wobrauschek, P., Ingerle, D., Rauwolf, M., Turyanskaya, A., Prost, J., Perneczky, L., & Pepponi, G. (2017). GIXRF, SR-TXRF-XANES and μ-XRF. IAEA technical meeting: F1-TM-52965 Trends in Analytical Applications and Instrumental Developments of Synchrotron Based X-Ray Spectrometry Techniques (2017), Vienna, Austria, Austria. http://hdl.handle.net/20.500.12708/133678 ( reposiTUm)

Streli, C., Rauwolf, M., Turyanskaya, A., Pemmer, B., Ingerle, D., Roschger, P., Roschger, A., Hofstätter, J., & Szoboszlai, N. (2017). Hard X-ray Spectroscopy of Biological Material using Synchrotron Radiation. NESY winterschool (2017), Altaussee, Austria, Austria. http://hdl.handle.net/20.500.12708/133376 ( reposiTUm)

Maderitsch, A., Ingerle, D., Rauwolf, M., Bretschneider, T., Pflumm, C., Buchholz, H., Borchert, H., Streli, C., & Parisi, J. (2017). Investigation of organic multilayer structures using a combined GIXRF/XRR approach. 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2017), Brescia, Italy. http://hdl.handle.net/20.500.12708/133619 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Artner, W., Hradil, K., Wobrauschek, P., & Streli, C. (2017). Characterization of nanomaterials with GIXRF and XRR using lab sources. 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2017), Brescia, Italy. http://hdl.handle.net/20.500.12708/133586 ( reposiTUm)

Wobrauschek, P., Ingerle, D., & Streli, C. (2017). Grazing incidence X-ray fluorescence and X-ray reflectivity for the characterization of nanometer-layers and ultra-shallow-implants using JGIXA - a software package for the calculation and fitting. BAM 2017, Berlin, Germany. http://hdl.handle.net/20.500.12708/133677 ( reposiTUm)

Prost, J., Zinkl, A., Ingerle, D., Wobrauschek, P., Streli, C., Eichert, D. M., Jark, W., Pepponi, G., Migliori, A., Karydas, A. G., Czyzycki, M., Buzanich, G., Reinholz, U., Riesemeier, H., & Radtke, M. (2017). Applica on of SR-TXRF-XANES for the Analysis of Indoor Aerosol Samples at BESSYII and ELETTRA. Annual Denver X-ray Conference 2017, Big Sky, United States of America (the). http://hdl.handle.net/20.500.12708/133679 ( reposiTUm)

Prost, J., Zinkl, A., Ingerle, D., Sterba, J. H., Wobrauschek, P., Streli, C., Eichert, D. M., Jark, W., Pepponi, G., Migliori, A., Karydas, A. G., Czyzycki, M., Buzanich, G., Reinholz, U., Riesemeier, H., & Radtke, M. (2017). Trace Element Analysis of Airborne Particulate Matter with TXRF and SR-TXRF-XANES. Annual Denver X-ray Conference 2017, Big Sky, United States of America (the). http://hdl.handle.net/20.500.12708/133682 ( reposiTUm)

Rotella, H., Caby, B., Ménesguen, Y., Ingerle, D., Novikova, A., Detlefs, B., Lépy, M. C., Licitra, C., Rodriguez, G., Streli, C., & Nolot, E. (2016). Elemental depth profiling in indium free TCO thin films for optoelectronic applications. European Materials Research Society (EMRS), Spring Meeting 2016, Lille, France. http://hdl.handle.net/20.500.12708/132708 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Wobrauschek, P., & Streli, C. (2016). JGIXA - a software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants. European Conference on X-ray Spectrometry (EXRS 2016), Göteborg, Sweden. http://hdl.handle.net/20.500.12708/132771 ( reposiTUm)

Ingerle, D., Szoboszlai, N., Papa, I., Sawhney, K., Turyanskaya, A., Rauwolf, M., & Streli, C. (2016). High resolution imaging of metal localization in cancer cells at the B16 beamline at Diamond. X-Ray Microscopy Conference (XRM 2016), Oxford, United Kingdom of Great Britain and Northern Ireland (the). http://hdl.handle.net/20.500.12708/132909 ( reposiTUm)

Streli, C., Ingerle, D., Pepponi, G., Wobrauschek, P., & Prost, J. (2016). SR-GIXRF and SR-TXRF-XANES. IAEA CPR meeting (2016), Triest, Italy. http://hdl.handle.net/20.500.12708/132762 ( reposiTUm)

Ingerle, D., Artner, W., Hradil, K., & Streli, C. (2016). Refitting an X-ray Diffraction System for combined GIXRF and XRR measurements. European Conference on X-ray Spectrometry (EXRS 2016), Göteborg, Sweden. http://hdl.handle.net/20.500.12708/132772 ( reposiTUm)

Wobrauschek, P., Allinger, P., Turyanskaya, A., Utz, A., Smolek, S., Ingerle, D., & Streli, C. (2016). MAXI 2D-spectrometer: compact scanning device with variable spot size in the mm range for large area macro-scans. European Conference on X-ray Spectrometry (2016), Gothenburg, Sweden. http://hdl.handle.net/20.500.12708/134685 ( reposiTUm)

Streli, C., Wobrauschek, P., Ingerle, D., Prost, J., Rauwolf, M., & Turyanskaya, A. (2015). Synchrotron Radiation Induced X-ray spectrometry - special techniques and applications. IAEA Technical Meeting on Developments in Instrumentation and Novel Techniques for X-Ray Spectrometry Applications (F1-TM-47480), Vienna, Austria, Austria. http://hdl.handle.net/20.500.12708/132064 ( reposiTUm)

Ingerle, D., Wobrauschek, P., Streli, C., Pepponi, G., & Meirer, F. (2015). JGIXA - A Software Package for the Calculation and Fitting of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data for the Characterization of Nanometer-layers and Ultra-shallow-implants. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131992 ( reposiTUm)

Streli, C., Rauwolf, M., Prost, J., Ingerle, D., & Wobrauschek, P. (2015). TXRF of low Z elements: Developments and Applications - A Review. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131993 ( reposiTUm)

Caby, B., Detlefs, B., Picot, G., Nolot, E., Brigidi, F., Pepponi, G., Ingerle, D., Streli, C., Lutterotti, L., Chateigner, D., & Morales, M. (2015). Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence Measurements. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131994 ( reposiTUm)

Wobrauschek, P., Prost, J., Ingerle, D., & Streli, C. (2015). A Vacuum TXRF Spectrometer with Sample Changer and Two Exchangeable Low Power Excitation Sources. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131995 ( reposiTUm)

Streli, C., Wobrauschek, P., Ingerle, D., Rauwolf, M., & Prost, J. (2015). Low Z TXRF. Cooperation BARC, Mumbai, India. http://hdl.handle.net/20.500.12708/131857 ( reposiTUm)

Streli, C., Ingerle, D., & Wobrauschek, P. (2015). Gixrf, Sr-Txrf, Srtxrf-Xanes. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131984 ( reposiTUm)

Ingerle, D., Wobrauschek, P., Streli, C., Pepponi, G., Leani, J. J., Migliori, A., Karydas, A. G., Eichert, D. M., Jark, W., Zecevic, J., & Meirer, F. (2015). Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab Spectrometer. TXRF 2015, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/131989 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Wobrauschek, P., & Streli, C. (2015). Measurement, calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implants. Chinese Conference on X-ray Spectrometry, Weihai, China. http://hdl.handle.net/20.500.12708/132023 ( reposiTUm)

Rauwolf, M., Pemmer, B., Ingerle, D., Wobrauschek, P., Streli, C., & Pahlke, A. (2014). Low Z TXRF measurements with a new SD detector with UTW. EXRS 2014, Bologna, Italy, EU. http://hdl.handle.net/20.500.12708/131239 ( reposiTUm)

Caby, B., Ingerle, D., Pepponi, G., Streli, C., Nolot, E., Mazen, F., Morales, M., & Chateigner, D. (2014). XRR & GiXRF combined analysis of Plasma Immersion Ion Implantation Ultra-Shallow junctions. EXRS 2014, Bologna, Italy. http://hdl.handle.net/20.500.12708/131254 ( reposiTUm)

Ingerle, D., Wobrauschek, P., & Streli, C. (2014). The influence of beam coherence on the GIXRF characterization of nanoparticles. EXRS 2014, Bologna, Italy. http://hdl.handle.net/20.500.12708/131256 ( reposiTUm)

Ingerle, D., Kirschner, J., Caby, B., & Streli, C. (2014). Investigation of fitness landscapes for GIXRF and XRR. EXRS 2014, Bologna, Italy. http://hdl.handle.net/20.500.12708/131251 ( reposiTUm)

Rauwolf, M., Ingerle, D., Pemmer, B., Wobrauschek, P., Streli, C., & Pahlke, A. (2014). Low Z TXRF measurements with a new Ketek SDD detector. 63th Denver X-ray Conference (2014), Big Sky Montana, United States of America (the). http://hdl.handle.net/20.500.12708/131293 ( reposiTUm)

Ingerle, D., Wobrauschek, P., & Streli, C. (2014). The influence of beam coherence on the GIXRF characterization of nanoparticles. 63th Denver X-ray Conference (2014), Big Sky Montana, United States of America (the). http://hdl.handle.net/20.500.12708/131296 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Schiebl, M., Giubertoni, D., Demenev, E., Wobrauschek, P., & Streli, C. (2014). New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRR. 63th Denver X-ray Conference (2014), Big Sky Montana, United States of America (the). http://hdl.handle.net/20.500.12708/131290 ( reposiTUm)

Rauwolf, M., Vanhoof, C., Tirez, K., Wobrauschek, P., Ingerle, D., & Streli, C. (2014). TXRF measurements of S and P in proteins using a special TXRF vacuum chamber for low Z elements. 63th Denver X-ray Conference (2014), Big Sky Montana, United States of America (the). http://hdl.handle.net/20.500.12708/131294 ( reposiTUm)

Ingerle, D., Kirschner, J., Caby, B., & Streli, C. (2014). Investigation of fitness landscapes for GIXRF and XRR. 63th Denver X-ray Conference (2014), Big Sky Montana, United States of America (the). http://hdl.handle.net/20.500.12708/131295 ( reposiTUm)

Rauwolf, M., Vanhoof, C., Tirez, K., Wobrauschek, P., Ingerle, D., & Streli, C. (2013). TXRF measurements of S and P in proteins using a special TXRF vacuum chamber for low Z elements. 15th Int. Conference on TXRF and related methods, Osaka, Japan, Non-EU. http://hdl.handle.net/20.500.12708/130380 ( reposiTUm)

Ingerle, D., Schiebl, M., Streli, C., Wobrauschek, P., & Pepponi, G. (2013). GIXRF for Nanotechnology. Workshop, Krems, Austria. http://hdl.handle.net/20.500.12708/126956 ( reposiTUm)

Caby, B., Nolot, E., Chateigner, D., Morales, M., Streli, C., Pepponi, G., Gergaud, P., Lutterotti, L., Ingerle, D., & Brigidi, F. (2013). XRR & GiXRF combined analysis of TCO/metal/TCO structures for photovoltaic applications. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130381 ( reposiTUm)

Szoboszlai, N., Gaál, A., Bsze, Sz., Majer, Z., Pepponi, G., Meirer, F., Ingerle, D., & Streli, C. (2013). Charact Determination and speciation of Rh in cancer cells by TXRF and K-edge SR TXRF XANES. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130379 ( reposiTUm)

Schiebl, M., Ingerle, D., Streli, C., & Wobrauschek, P. (2013). Characterization of thin films on Si wafers by GIXRF in combination with XRR. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130378 ( reposiTUm)

Pepponi, G., Meirer, F., Brigidi, F., Demenev, E., Giubertoni, D., Gennaro, S., Bersani, M., Ingerle, D., Streli, C., Steinhauser, G., Mehta, A., Pianetta, P., Vishwanath, V., & Foad, M. A. (2013). GIXRF and GEXRF analysis of PIII ultra shallow arsenic profiles in Silicon. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130370 ( reposiTUm)

Rauwolf, M., Ingerle, D., Pemmer, B., Wobrauschek, P., Streli, C., & Pahlke, A. (2013). Low Z TXRF measurements with a new Ketek SDD detector. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130372 ( reposiTUm)

Mihucz, V. G., Szoboszlai, N., Meirer, F., Szigeti, T., Polgari, Z., Ingerle, D., Pepponi, G., Appel, K., Majer, Z., & Streli, C. (2013). K-edge TXRF-XANES for elemental speciation in biological matrices. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130375 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Giubertoni, D., Demenev, E., Wobrauschek, P., & Streli, C. (2013). New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRR. 15th Int. Conference on TXRF and related methods, Osaka, Japan. http://hdl.handle.net/20.500.12708/130377 ( reposiTUm)

Meirer, F., Ingerle, D., Pepponi, G., Streli, C., Mehta, A., & Pianetta, P. (2013). GIXRF and GIXAS at Trace Levels. Denver X-Ray Conference 2013, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/126951 ( reposiTUm)

Schiebl, M., Ingerle, D., Streli, C., & Wobrauschek, P. (2013). Characterization of thin films on Si wafers by GIXRF in combination with XRR. Denver X-Ray Conference 2013, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/126955 ( reposiTUm)

Rauwolf, M., Ingerle, D., Pemmer, B., Wobrauschek, P., & Streli, C. (2013). Low Z TXRF measurements with a new SDD detector. ICXOM 2013, Hamburg, Germany. http://hdl.handle.net/20.500.12708/130357 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Schiebl, M., Giubertoni, D., Demenev, E., Wobrauschek, P., & Streli, C. (2013). New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRR. ICXOM 2013, Hamburg, Germany. http://hdl.handle.net/20.500.12708/130354 ( reposiTUm)

Schiebl, M., Ingerle, D., Streli, C., & Wobrauschek, P. (2013). Instrumental setup for simultaneous GIXRF and XRR measurement for Characterization of thin films on Si wafers. ICXOM 2013, Hamburg, Germany. http://hdl.handle.net/20.500.12708/130355 ( reposiTUm)

Szoboszlai, N., Meirer, F., Pepponi, G., Ingerle, D., & Streli, C. (2012). Iron speciation in human cancer cell lines by K-edge SRTXRF-XANES. EXRS Conference, Paris, France. http://hdl.handle.net/20.500.12708/129661 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Demenev, E., Giubertoni, D., & Streli, C. (2012). Modelling shallow dopant distributions as layered samples for grazing incidence x-ray fluorescence analysis. EXRS Conference, Paris, France. http://hdl.handle.net/20.500.12708/129662 ( reposiTUm)

Dhara, S., Misra, N. L., Aggarwal, S. K., Ingerle, D., Wobrauschek, P., & Streli, C. (2012). Determinations of low atomic number elements in real uranium oxide samples using Vacuum Chamber TXRF. EXRS Conference, Paris, France. http://hdl.handle.net/20.500.12708/129659 ( reposiTUm)

Streli, C., Pemmer, B., Wobrauschek, P., Ingerle, D., Meirer, F., & Pepponi, G. (2011). Synchrotron radiation induced TXRF. Seminar, Ecole Centrale Paris, EU. http://hdl.handle.net/20.500.12708/129216 ( reposiTUm)

Streli, C., Ingerle, D., Pemmer, B., Wobrauschek, P., Meirer, F., & Pepponi, G. (2011). Synchrotron radiation induced x-ray spectrometry. Micro-analytical techniques based on nuclear spectrometry for environmental monitoring and material studies, Vienna, Austria, Austria. http://hdl.handle.net/20.500.12708/129207 ( reposiTUm)

Streli, C., Ingerle, D., Wobrauschek, P., Meirer, F., & Pepponi, G. (2011). Recent development of GIXRF and applications in material sciences. Annual Meeting, Okinawa, Japan, Non-EU. http://hdl.handle.net/20.500.12708/129200 ( reposiTUm)

Streli, C., Ingerle, D., Wobrauschek, P., Meirer, F., & Pepponi, G. (2011). Synchrotron radiation induced grazing incidence XRF for material science. Application of Synchrotron radiation sources for compositional and structural characterization of objects in cultural heritage, florensics and material sciences, Vienna, Austria, Austria. http://hdl.handle.net/20.500.12708/129206 ( reposiTUm)

Ingerle, D., Pepponi, G., Meirer, F., Streli, C., Wobrauschek, P., van den Berg, J. A., & Reading, M. A. (2011). Combined approach of GIXRF+XRR for Characterization of thin films on Si wafers. TXRF 2011 Conference, Dortmund, Germany, EU. http://hdl.handle.net/20.500.12708/128925 ( reposiTUm)

Meirer, F., Pepponi, G., Ingerle, D., Sahiner, M. A., Giubertoni, D., Demenev, E., Foad, M. A., Woicik, J. C., Mehta, A., Streli, C., & Pianetta, P. (2011). Characterization of ultra shallow arsenic implants in silicon using grazing incidence and grazing exit x-ray spectroscopy. TXRF 2011 Conference, Dortmund, Germany, EU. http://hdl.handle.net/20.500.12708/128922 ( reposiTUm)

Wobrauschek, P., Sasamori, S., Streli, C., Horntrich, C., Ingerle, D., & Meirer, F. (2010). Recent advances and applications in TXRF of the Atominstitut X-ray group. EXRS 2010, Figueira da Foz, Portugal, EU. http://hdl.handle.net/20.500.12708/128275 ( reposiTUm)

Ingerle, D., Meirer, F., Zöger, N., Pepponi, G., Giubertoni, D., Wobrauschek, P., & Streli, C. (2009). Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf Layer. TXRF conference 2009, Goetheborg, EU. http://hdl.handle.net/20.500.12708/127664 ( reposiTUm)

Ingerle, D., Zöger, N., Wobrauschek, P., Streli, C., Meirer, F., Pepponi, G., & Giubertoni, D. (2009). Spectrometer For Grazing Incidence Xrf: Characterization Of As Implants And Hf Layers. 58th Denver X-ray Conference, Colorado Springs, Non-EU. http://hdl.handle.net/20.500.12708/127668 ( reposiTUm)

Osan, J., Meirer, F., Török, S., Ingerle, D., Streli, C., & Pepponi, G. (2009). Speciation of copper and zinc in size-fractionated aerosol samples using TXRF-XANES. TXRF conference 2009, Goetheborg, EU. http://hdl.handle.net/20.500.12708/127667 ( reposiTUm)

Meirer, F., Pepponi, G., Ingerle, D., Pahlke, S., & Streli, C. (2009). Retrofitting of an ATOMIKA 8010 TXRF Wafer-analyzer for GI-XRF Analysis. TXRF conference 2009, Goetheborg, EU. http://hdl.handle.net/20.500.12708/127665 ( reposiTUm)

Osan, J., Meirer, F., Török, S., Ingerle, D., Streli, C., & Pepponi, G. (2009). Speciation of copper and zinc in size-fractionated aerosol samples using TXRF-XANES. ICXOM 2009, Karlsruhe, EU. http://hdl.handle.net/20.500.12708/127785 ( reposiTUm)

Polgari, Z., Meirer, F., Sasamori, S., Ingerle, D., Pepponi, G., Streli, C., Rickers, K., Réti, A., Budai, B., Szoboszlai, N., & Zaray, G. (2009). Iron speciation in human cancer cells by K-edge TXRF-XANES. CSI Colloquium Spectroscopicum Internationale XXXVI, Budapest, EU. http://hdl.handle.net/20.500.12708/127777 ( reposiTUm)

Polgari, Z., Meirer, F., Sasamori, S., Ingerle, D., Pepponi, G., Rickers, K., Réti, A., Budai, B., Szoboszlai, N., Zaray, G., Wobrauschek, P., & Streli, C. (2009). Iron speciation in human cancer cells by K-edge SR-TXRF-XANES. ICXOM 2009, Karlsruhe, EU. http://hdl.handle.net/20.500.12708/127781 ( reposiTUm)

Ingerle, D., Meirer, F., Zöger, N., Pepponi, G., Giubertoni, D., Wobrauschek, P., & Streli, C. (2009). A GIXRF laboratory insrument for the characterization of ultra shallow implants and thin films. ALTECH ECS Meeting, Wien, Austria. http://hdl.handle.net/20.500.12708/127791 ( reposiTUm)

Giubertoni, D., Pepponi, G., Beckhoff, B., Hoenicke, P., Gennaro, S., Meirer, F., Ingerle, D., Steinhauser, G., Fried, M., Petrik, P., Parisini, A., Reading, M. A., Streli, C., van den Berg, J. A., & Bersani, M. (2009). Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium. Frontiers of Characterization and Metrology for Nanoelectronics, College of Nanoscale Science and Engineering, University at Albany, Albany, NY, Non-EU. http://hdl.handle.net/20.500.12708/127615 ( reposiTUm)

Pepponi, G., Meirer, F., Giubertoni, D., Ingerle, D., Steinhauser, G., Streli, C., Hoenicke, P., Beckhoff, B., & Bersani, M. (2009). Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon. International Workshop on INSIGHT in Semiconductor Device Fabriaction, Metrology, and Modeling (INSIGHT-2009), Napa, CA, Non-EU. http://hdl.handle.net/20.500.12708/127616 ( reposiTUm)

Zöger, N., Ingerle, D., Streli, C., Meirer, F., Wobrauschek, P., & Pepponi, G. (2008). Tabletop Spectrometer for Grazing Incidence XRF. Denver X-Ray Conference, Denver Colorado, Non-EU. http://hdl.handle.net/20.500.12708/127002 ( reposiTUm)

Zöger, N., Ingerle, D., Streli, C., Meirer, F., Wobrauschek, P., & Pepponi, G. (2008). Tabletop Spectrometer for Grazing Incidence XRF. EXRS Conference, Paris, France. http://hdl.handle.net/20.500.12708/127014 ( reposiTUm)

Zöger, N., Streli, C., Pepponi, G., Schraik, I., Ingerle, D., & Wobrauschek, P. (2007). Prototype for depth profiling of ultra shallow junctions with Grazing Incidence X-ray Fluorescence Analysis. ICXOM 2007, Kyoto (Japan), Non-EU. http://hdl.handle.net/20.500.12708/126702 ( reposiTUm)

Ingerle, D., Szoboszlai, N., Pepponi, G., Meirer, F., Majer, Z., Wobrauschek, P., & Streli, C. (2012). Rh speciation in cancer cellines by K-edge SR TXRF XANES. http://hdl.handle.net/20.500.12708/37757 ( reposiTUm)

Ingerle, D., Szoboszlai, N., Pepponi, G., Meirer, F., Majer, Z., Wobrauschek, P., & Streli, C. (2011). Rh speciation in cancer cellines by K-edge SR TXRF-XANES. http://hdl.handle.net/20.500.12708/37758 ( reposiTUm)

Streli, C., Ingerle, D., Pemmer, B., Wobrauschek, P., Meirer, F., & Pepponi, G. (2011). Synchrotron radiation induced x-ray spectrometry. http://hdl.handle.net/20.500.12708/36977 ( reposiTUm)

Osan, J., Meirer, F., Török, S., Ingerle, D., Streli, C., Pepponi, G., & Rickers-Appel, K. (2010). Copper speciation in size-fractionated aerosol samples using TXRF-XANES (No. 2009724). http://hdl.handle.net/20.500.12708/36462 ( reposiTUm)

Polgari, Z., Meirer, F., Ingerle, D., Pepponi, G., Szoboszlai, N., Budai, B., Zaray, G., Falkenberg, G., & Streli, C. (2010). Iron Speciation in human cancer cell lines by K-edge SRTXRF-XANES (No. 2009570). http://hdl.handle.net/20.500.12708/36463 ( reposiTUm)

Polgari, Z., Szoboszlai, N., Meirer, F., Ingerle, D., Pepponi, G., Budai, B., Zaray, G., Appel, K., & Streli, C. (2010). Iron Speciation in human cancer cell lines by K-edge SRTXRF-XANES. http://hdl.handle.net/20.500.12708/37760 ( reposiTUm)

Ingerle, D., Pepponi, G., Streli, C., & Wobrauschek, P. (2010). GIXRF and XRR characterization of near surface layers. http://hdl.handle.net/20.500.12708/37759 ( reposiTUm)

Osan, J., Meirer, F., Török, S., Ingerle, D., Streli, C., Pepponi, G., & Rickers-Appel, K. (2009). Copper speciation in size-fractionated aerosol samples using TXRF-XANES. http://hdl.handle.net/20.500.12708/37761 ( reposiTUm)

Ingerle, D. (2017). Grazing incidence X-ray fluorescence combined with X-ray reflectivity: development of an evaluation software [Dissertation, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2017.35981 ( reposiTUm)

Ingerle, D. (2015). A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers [Diploma Thesis, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2015.33461 ( reposiTUm)