Stöger-Pollach, M. (2022, September 6). The choice of the right beam energy for analytical (scanning) transmission electron microscopy [Conference Presentation]. 16th MCM, Brünn, Czechia. ( reposiTUm)

Scales, Z., Reisinger, M., Taylor, A., Nelhiebel, M., & Stöger-Pollach, M. (2022, November 24). Physical Characterization of Dislocations in III-N Semiconductors including Quantification and Classification [Poster Presentation]. Infineon meets University, München, Germany. http://hdl.handle.net/20.500.12708/81243 ( reposiTUm)