Kumar, A. M., Yagodkin, D., Rosati, R., Bock, D., Schattauer, C., Tobisch, S., Hagel, J., Höfer, B., Kirchhof, J. N., Hernández López, P., Burfeindt, K., Heeg, S., Gahl, C., Libisch, F., Malic, E., & Bolotin, K. I. (2024). Strain fingerprinting of exciton valley character in 2D semiconductors.
Nature Communications,
15(1), 1–8.
https://doi.org/10.1038/s41467-024-51195-y ( reposiTUm)