Kammerstetter, M., Muellner, M., Burian, D., Platzer, C., & Kastner, W. (2014). Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering. In
Proceedings of the 2014 ACM SIGSAC Conference on Computer and Communications Security. 21st ACM Conference on Computer and Communications Security (ACM CCS), Scottsdale, Arizona, USA, Non-EU.
https://doi.org/10.1145/2660267.2660301 ( reposiTUm)