Book of Abstracts: The 15th International Symposium Electron Beam Ion Sources and Traps (EBIST 2024)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Niggas, Anna ; Werl, Matthias ; Vojtech, Victoria ; Vukovic, Filip ; Aumayr, Friedrich ; Wilhelm, Richard Arthur	Highly-charged-ion-induced electron emission from surfaces	Inproceedings Konferenzbeitrag	27-Aug-2024