Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

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Book title Buchtitel
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
 
Publisher Herausgeber
Springer Nature Switzerland AG 2021
 
DOI
10.1007/978-3-319-49055-7
 
Series Schriftenreihe
Lecture Notes in Computer Science
 

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1Gabdulkhakova, Aysylu ; Kropatsch, Walter G. Detecting Ellipses in Elongated Shapes Using the Thickness ProfileKonferenzbeitrag Inproceedings 2016