17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Book title Buchtitel
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
 
ISBN
9781479945580
 
Publisher Herausgeber
IEEE
Institute of Electrical and Electronics Engineers (IEEE)
 
Place of publishing Erscheinungsort
Warsaw
 
DOI
10.1109/DDECS32181.2014
 
Series Schriftenreihe
IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS)
 

Publications Publikationen



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PreviewAuthor(s)TitleTypeIssue Date
1Maier Juergen - 2014 - Online Test Vector Insertion A Concurrent Built-In...pdf.jpgMaier, Jürgen ; Steininger, Andreas Online Test Vector Insertion: A Concurrent Built-In Self-Testing (CBIST) Approach for Asynchronous LogicInproceedings Konferenzbeitrag 2014