35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2024): Proceedings

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		Preview	Author(s)	Title	Type	Issue Date
	1		Wieland, Dominik ; Butej, Boris ; Stabentheiner, Manuel ; Koller, Christian ; Pogany, Dionyz ; Ostermaier, Clemens	Analyzing the role of hole injection on the short circuit performance of p-GaN gate power HEMTs	Inproceedings Konferenzbeitrag	25-Sep-2024