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ECS Transactions
 
 
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Author:  Schanovsky, Franz

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PreviewAuthor(s)TitleTypeIssue Date
1Sverdlov, Viktor ; Baumgartner, Oskar ; Windbacher, Thomas ; Schanovsky, Franz ; Selberherr, Siegfried Impact of Confinement and Stress on the Subband Parameters in Ultra-Thin Silicon FilmsKonferenzbeitrag Inproceedings2009
2Goes, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp ; Wagner, Paul-Juergen ; Grasser, Tibor (Invited) Charge Trapping and the Negative Bias Temperature InstabilityBuchbeitrag Book Contribution2010
3Goes, Wolfgang ; Toledano-Luque, Maria ; Schanovsky, Franz ; Bina, Markus ; Baumgartner, Oskar ; Kaczer, Ben ; Grasser, Tibor (Invited) Multiphonon Processes as the Origin of Reliability IssuesKonferenzbeitrag Inproceedings2013