Bias Temperature Instability for Devices and Circuits
Book title Buchtitel
Bias Temperature Instability for Devices and Circuits
Editor Herausgeber_in
Publisher Herausgeber
Springer New York
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Goes, Wolfgang ; Schanovsky, Franz ; Grasser, Tibor ; Grasser, Tibor | Advanced Modeling of Oxide Defects | Buchbeitrag Book Contribution | 2013 | |
| 2 | Schanovsky, Franz ; Grasser, Tibor ; Grasser, Tibor | On the Microscopic Limit of the RD Model | Buchbeitrag Book Contribution | 2013 | |
| 3 | Grasser, Tibor ; Grasser, Tibor | The Capture/Emission Time Map Approach to the Bias Temperature Instability | Buchbeitrag Book Contribution | 2013 |