Mico Total Analysis Systems
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Mico Total Analysis Systems
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Kaun, Nina ; Kulka, Stephan ; Baena, Josefa ; Schade, Ulrich ; Vellekoop, Michael J. ; de Lorenzi, Ersilia ; Lendl, Bernhard | Synchrotron Radiation for on-chip MID-IR Detection at the Diffraction Limit | Konferenzbeitrag Inproceedings | 2004 |