IEEE Industry Applications Conference 2005
Book title Buchtitel
IEEE Industry Applications Conference 2005
Publisher Herausgeber
IEEE
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Belbachir, Ahmed Nabil ; Lera, Mario ; Fanni, Alessandra | An automatic inspection system for the diagnosis of printed circuits based on neural networks | Konferenzbeitrag Inproceedings  | 2005 |