5th ACM-IEEE International Symposium on Empirical Software Engineering
Book title Buchtitel
5th ACM-IEEE International Symposium on Empirical Software Engineering
Publisher Herausgeber
ACM Press
Place of publishing Erscheinungsort
Vol. 2, NY
Results 1-2 of 2 (Search time: 0.002 seconds).
Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Winkler, Dietmar ; Varvaroi, R ; Goluch, Gernot ; Biffl, Stefan | An Empirical Study On Integrating Analytical Quality Assurance Into Pair Programming | Konferenzbeitrag Inproceedings | 2006 | |
2 | Heindl, Matthias ; Biffl, Stefan ; Egyed, Alexander | The Impact of Trace Correctness on Requirements Tracing Cost-Benefit - An Evaluation Concept | Konferenzbeitrag Inproceedings | 2006 |