4th Workshop on Intelligent Solutions in Embedded Systems (WISES'06), Proceedings of the
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4th Workshop on Intelligent Solutions in Embedded Systems (WISES'06), Proceedings of the
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Kandl, Susanne ; Kirner, Raimund ; Puschner, Peter | Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems | Konferenzbeitrag Inproceedings | 2006 |