Proceedings IDT'07 - The Second International Design and Test Workshop
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Proceedings IDT'07 - The Second International Design and Test Workshop
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Handl, Thomas ; Steininger, Andreas ; Kempf, Gerald | Adopting the Scan Approach for a Fault Tolerant Asynchronous Clock Generation Circuit | Konferenzbeitrag Inproceedings  | 2007 |