Proceedings of the 7th International Symposium on Image and Signal Processing and Analysis (ISPA 2011)

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Publisher Verlag

IEEE

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		Preview	Author(s)	Title	Type	Issue Date
	1		Bhatti, Naeem ; Hanbury, Allan	Granulometry based Detection of Junction and End Points in Patent Drawings	Konferenzbeitrag Inproceedings	2011