IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society

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IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
 

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Author:  Zoitl, Alois
Subject:  IEC 61499

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PreviewAuthor(s)TitleTypeIssue Date
1Hametner, Reinhard ; Winkler, Dietmar ; Zoitl, Alois Agile Testing Concepts Based on Keyword-driven Testing for Industrial Automation SystemsKonferenzbeitrag Inproceedings 2012