2017 IEEE International Conference on Industrial Technology (ICIT)
Book title Buchtitel
2017 IEEE International Conference on Industrial Technology (ICIT)
Publisher Herausgeber
IEEE
Results 1-2 of 2 (Search time: 0.001 seconds).
Preview | Authors / Editors | Title | Type | Issue Date | |
---|---|---|---|---|---|
1 | Wang, Guodong ; Hasani, Ramin ; Yungang, Zhu ; Grosu, Radu | A novel Bayesian network-based fault prognostic method for semiconductor manufacturing process | Konferenzbeitrag Inproceedings | 2017 | |
2 | Ismail, Ahmed ; Kastner, Wolfgang | Surveying the features of industrial SOAs | Konferenzbeitrag Inproceedings | 2017 |