2017 IEEE International Conference on Industrial Technology (ICIT)

Book title Buchtitel
2017 IEEE International Conference on Industrial Technology (ICIT)
 
Publisher Herausgeber
IEEE
 

Publications Publikationen

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wang, Guodong ; Hasani, Ramin ; Yungang, Zhu ; Grosu, Radu A novel Bayesian network-based fault prognostic method for semiconductor manufacturing processKonferenzbeitrag Inproceedings 2017
2Ismail, Ahmed ; Kastner, Wolfgang Surveying the features of industrial SOAsKonferenzbeitrag Inproceedings 2017