Proceedings of the 26th IEEE Asian Test Symposium (ATS´17)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Andjelkovic, Marko ; Krstic, Milos ; Kraemer, Rolf ; Veeravalli, Varadan Savulimedu ; Steininger, Andreas	A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study	Konferenzbeitrag Inproceedings	2017