Proceedings of the 26th IEEE Asian Test Symposium (ATS´17)
Book title Buchtitel
Proceedings of the 26th IEEE Asian Test Symposium (ATS´17)
Subject
Date issued
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Andjelkovic, Marko ; Krstic, Milos ; Kraemer, Rolf ; Veeravalli, Varadan Savulimedu ; Steininger, Andreas | A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study | Konferenzbeitrag Inproceedings  | 2017 |