2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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Publisher Herausgeber

IEEE

Place of publishing Erscheinungsort

Germany

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Author: Bouganis, Christos-Savvas

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		Preview	Author(s)	Title	Type	Issue Date
	1		Shafique, Muhammad ; Theocharides, Theocharis ; Bouganis, Christos-Savvas ; Hanif, Muhammad Abdullah ; Khalid, Faiq ; Hafiz, Rehan ; Rehman, Semeen	An overview of next-generation architectures for machine learning: Roadmap, opportunities and challenges in the IoT era	Konferenzbeitrag Inproceedings	2018

2018 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)