2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Book title Buchtitel
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Publisher Herausgeber
IEEE Xplore Digital Library
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Schütz, Markus ; Steininger, Andreas ; Huemer, Florian ; Lechner, Jakob | State Recovery for Coarse-Grain TMR Designs in FPGAs Using Partial Reconfiguration | Konferenzbeitrag Inproceedings  | 2018 |